Structured Light-Sheet Illumination for Isotropic Resolution

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Solution Overview

Problem

Current light sheet fluorescence microscopy techniques face challenges in achieving isotropic resolution enhancement and high image quality due to limitations in structured illumination methods, which often result in background noise, fluorophore bleaching, and sample damage from non-focused illumination.

Innovation Solution

The method involves spatially splitting an illumination light beam into partial beams that interfere in an illumination plane to generate a pattern, allowing for improved resolution and reduced background noise by using a shared illumination objective and position-sensitive detection, with the option to superimpose additional patterns for enhanced image quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Illumination intensity

If a light sheet is used to illuminate the sample, then illumination intensity is improved and sample damage is reduced, but image resolution and contrast are limited due to uniform illumination

Engineering Contradiction:
Improveillumination intensityVSAvoidimage resolution
Core Design Contradiction:
Illumination intensityVSMeasurement precision

Solution Approach 1:

The uniform light sheet illumination is segmented into structured illumination patterns (such as lines, grids, or other geometric patterns) that selectively illuminate specific regions within the sample plane. This segmentation allows for enhanced contrast and resolution by creating intensity modulations that can be mathematically reconstructed to achieve super-resolution imaging, while maintaining the gentle sample illumination benefits of light sheet microscopy.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Structured illumination patterns are applied periodically or in multiple phases to the sample, allowing for the extraction of high-frequency spatial information through computational reconstruction. By acquiring multiple images with different illumination pattern phases and combining them, the system achieves enhanced resolution beyond the diffraction limit while maintaining low light exposure per frame.

Inventive Principle:
Principle #19Periodic action

2Measurement precision

If structured illumination is applied to enhance resolution, then image resolution is improved, but background noise and fluorophore bleaching increase

Engineering Contradiction:
Improveimage resolutionVSAvoidbackground noise
Core Design Contradiction:
Measurement precisionVSObject-generated harmful factors

Solution Approach 1:

Instead of uniformly illuminating the entire sample, structured illumination applies localized intensity variations only to specific regions and orientations within each illumination plane. This local quality approach enhances resolution in targeted areas while minimizing overall light exposure and associated background noise, allowing for selective enhancement of structural features without excessive fluorophore activation or bleaching.

Inventive Principle:
Principle #3Local quality

3Measurement precision

If multiple illumination objectives are used to achieve isotropic resolution, then image resolution is improved, but device complexity increases

Engineering Contradiction:
Improveisotropic resolutionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system employs dynamic control of illumination patterns through spatial light modulators or acousto-optic deflectors that can rapidly switch between different pattern orientations and phases. This dynamic capability allows a single illumination objective to achieve isotropic resolution enhancement by sequentially applying structured illumination from multiple virtual directions, eliminating the need for multiple physical objectives while maintaining computational flexibility.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances image resolution and contrast while minimizing sample damage by focusing illumination precisely within the plane of focus, allowing for higher-frequency patterns and efficient light usage, particularly beneficial for SPIM and TIRF microscopy.

Implementation Method 1

at least one of the partial illumination light beams is deflected using at least one deflector such that the partial illumination light beams interfere with one another in an illumination plane so as to generate an illumination pattern in the illumination plane

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

The illumination light beam is spatially split into at least two partial illumination light beams using a splitter

Methodology Applied
Scientific EffectOptical splitting:

Implementation Method 3

An image of a sample region illuminated by the illumination pattern is produced, wherein detection light that emanates from the sample region reaches a position-sensitive detector

Methodology Applied
Scientific EffectOptical detection:

Data Source

PatentUS11092792B2Method and apparatus for examining a sample using structured light-sheet illumination
Publication Date: 2021.08.17 LEICA MICROSYSTEMS CMS GMBH
  • US11092792B2 patent drawing
  • US11092792B2 patent drawing
  • US11092792B2 patent drawing

AI summary

A method for examining a sample in light sheet fluorescence microscopy includes generating an illumination light beam using a light source. The illumination light beam is spatially split into at least two partial illumination light beams using a splitter. The partial illumination light beams are guided through an illumination objective shared by the partial illumination light beams. After the partial illumination light beams have passed through the illumination objective, at least one of the partial illumination light beams is deflected using at least one deflector such that the partial illumination light beams interfere with one another in an illumination plane so as to generate an illumination pattern in the illumination plane. An image of a sample region illuminated by the illumination pattern is produced, wherein detection light that emanates from the sample region reaches a position-sensitive detector through a detection objective.