Structured Calibration Light Source for Broad-Range Spectrometer Alignment

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Solution Overview

Problem

Existing spectrometer calibration methods using reference lamps and broad-band light sources are inefficient, costly, and unreliable, particularly in specific spectral ranges, and require multiple calibration procedures, while verification methods face challenges with environmental compatibility and logistical issues of reference samples.

Innovation Solution

A calibration light source with a broad-band light source and filter that emits structured light with identifiable spectral reference lines, enabling simultaneous calibration and verification of both spectral and intensity axes, using filters like etalon or gas-based atomic absorption to create a tailored emission spectrum.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If reference lamps with known atomic emission lines are used for spectral axis calibration, then wavelength/frequency assignment accuracy is improved, but the reference points may be absent in spectral ranges of special interest resulting in poor characterization of spectral distribution

Engineering Contradiction:
Improvewavelength assignment accuracyVSAvoidspectral range coverage
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent combines a broad-band light source (tungsten lamp) that provides continuous spectral coverage with a filter (gas cell containing neon, argon, or xenon) that adds discrete reference lines. This merging allows simultaneous achievement of broad spectral range coverage and precise wavelength assignment at specific reference lines, resolving the contradiction between measurement precision and spectral range adaptability.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The filter assembly serves multiple functions: it provides wavelength reference lines for calibration, maintains broad spectral coverage through the underlying continuum source, and enables verification of calibration accuracy. The same system accommodates different gas types (neon, argon, xenon) to provide reference lines across different spectral regions, enhancing versatility.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Manufacturing precision

If separate calibration procedures are performed for spectral axis and intensity axis, then calibration completeness is improved, but calibration time and complexity increase

Engineering Contradiction:
Improvecalibration completenessVSAvoidcalibration time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent merges spectral axis calibration and intensity axis calibration into a single calibration procedure using one integrated light source system. The broad-band source with filter provides both the reference lines needed for wavelength calibration and the continuous spectrum needed for intensity/responsivity calibration, eliminating the need for separate calibration steps and reducing total calibration time.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The calibration light source system performs multiple calibration functions simultaneously: it provides reference lines for spectral axis calibration and continuous spectral output for intensity axis calibration. This multi-functional approach allows both types of calibration to be accomplished in one operation rather than requiring separate procedures.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If complex reference samples are used for calibration verification, then verification accuracy is improved, but logistical challenges and environmental sensitivity increase

Engineering Contradiction:
Improveverification accuracyVSAvoidlogistical ease
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent uses a gas cell filter that creates artificial reference lines by absorbing light at specific wavelengths corresponding to atomic transitions of the gas atoms (neon, argon, or xenon). These reference lines are well-known and can be precisely calculated from atomic physics, providing a reliable verification standard without requiring complex physical reference samples. The system copies the known atomic emission spectrum in absorption form for verification purposes.

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Provides efficient, cost-effective calibration and verification of spectrometers across a broad spectral range, ensuring accurate spectral distribution and intensity measurements, overcoming limitations of previous methods.

Implementation Method 1

a broad band light source emitting light in a broad spectral range

Methodology Applied
Scientific EffectIncandescence: Incandescence

Implementation Method 2

a filter receiving light emitted by the broad band light source and providing structured light by imposing an attenuation pattern exhibiting pattern features at multiple spectral reference lines

Methodology Applied
Scientific EffectAbsorption (EM radiation): Absorption (EM radiation)

Data Source

PatentUS12624995B2Calibration light source and method of calibrating spectrometers
Publication Date: 2026.05.12 ENDRESSHAUSER OPTICAL ANALYSIS INC
  • US12624995B2 patent drawing
  • US12624995B2 patent drawing
  • US12624995B2 patent drawing

AI summary

A calibration light source includes: a broad band light source emitting light in a broad spectral range; and a filter receiving light emitted by the broad band light source and providing structured light by imposing an attenuation pattern exhibiting pattern features at multiple spectral reference lines on the received light such that an emission spectrum of the structured light emitted by the calibration light source exhibits distinct, identifiable emission spectrum features corresponding to the pattern features at the multiple spectral reference lines. A method of calibrating at least one spectrometer using the calibration light source is further disclosed.