Measuring Probe Defect Judging with Four-Signal Threshold Checks
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Solution Overview
Problem
Conventional measuring probes lack a mechanism to detect defects, leading to potential measurement inaccuracies and reduced reliability, as users may continue to use defective probes without realizing the issue, resulting in wasted measurements.
Innovation Solution
A defect judging unit for measuring probes, comprising a stylus, detection elements, and a signal processing device with a defect judging circuit that compares signals with predetermined thresholds to identify defects, along with a signal amplifying and offset correction circuit to ensure accurate defect detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If no defect detection mechanism is provided in the measuring probe, then the device complexity is low, but the measurement reliability deteriorates as users may continue to use defective probes without realizing the issue
Solution Approach 1:
The defect judging circuit performs preliminary defect detection by comparing detection element outputs against threshold values before measurement operations proceed. This preliminary action identifies defective probes in advance, preventing unreliable measurements while maintaining relatively simple circuit architecture through proactive rather than reactive defect detection.
2Reliability
If a defect judging circuit is added to the measuring probe, then the measurement reliability is improved, but the device complexity increases due to additional circuits
Solution Approach 1:
The defect judging circuit is merged with the existing signal processing circuitry of the measuring probe. The defect judging circuit shares the detection element outputs and integrates the threshold comparison function within the existing signal processing path, thereby improving reliability without requiring completely separate defect detection hardware.
Solution Approach 2:
The signal processing circuit is designed to serve dual functions: normal measurement signal processing and defect detection through threshold comparison. This multi-functionality allows the same hardware infrastructure to support both measurement operations and defect identification, reducing overall device complexity while maintaining reliability improvements.
3Measurement precision
If signal amplifying and offset correction circuits are added, then the defect detection accuracy is improved, but the device complexity and manufacturing cost increase
Solution Approach 1:
The signal amplifying circuit and offset correction circuit perform preliminary signal conditioning before the defect judgment comparison. By amplifying weak detection signals and correcting offset errors in advance, these circuits ensure that the threshold comparison operates on optimized signals, thereby improving defect detection accuracy without requiring complex real-time adjustment mechanisms.
Data Source
AI summary
Provided is a defect judging unit for a measuring probe including: a stylus; four detection elements; and a signal processing part. The defect judging unit includes a defect judging part configured to compare four judged signals corresponding to the generated signals with predetermined thresholds when the object to be measured and the contact part are out of contact with each other and judge that a defect exists if any of the judged signals is greater than the predetermined threshold, and a judged result output part configured to output a judged result of the defect judging part. According to this configuration, the defect judging unit of the measuring probe and the defect judging method thereof capable of ensuring measurement reliability with a simple configuration are provided.