Stylus Error Correction for Pivot-Type Measuring Instruments
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Solution Overview
Problem
Conventional precision measuring instruments face challenges in accurately correcting measurement errors caused by the circular motion of pivot-type styluses, particularly due to vertical movement errors in the YZ plane, which are not adequately addressed by existing correction methods.
Innovation Solution
A correction method and measuring instrument that includes a calibration measurement step and a correction parameter setting step to determine optimal vertical movement error correction parameters, using a reference sphere to obtain calibration data and compare actual and ideal moving loci, allowing for precise correction of measurement errors in the YZ plane.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional correction algorithms are used to correct measurement errors due to circular motion of pivot-type styluses, then measurement accuracy is improved, but vertical movement errors in the YZ plane are not adequately addressed, limiting further improvement
Solution Approach 1:
The correction process is divided into two distinct components: correction for circular motion errors in the XZ plane and correction for vertical movement errors in the YZ plane. Each component has its own correction parameters and calibration procedure, allowing independent optimization of each error source without interference from the other.
Solution Approach 2:
The invention extends the correction approach from the conventional two-dimensional XZ plane to include the three-dimensional YZ plane. By introducing correction parameters for vertical movement in the YZ plane and using a reference sphere for calibration, the system achieves comprehensive three-dimensional error correction, enabling measurement accuracy improvement beyond what was previously possible with two-dimensional correction alone.
2Measurement precision
If correction parameters are determined using calibration measurement data from a reference sphere, then correction accuracy is improved, but the calibration process becomes more complex
Solution Approach 1:
The reference sphere serves multiple functions: it provides known geometric features for calibration measurement, enables determination of both XZ-plane and YZ-plane correction parameters, and validates the complete correction system. This multi-functional use of a single calibration artifact simplifies the overall calibration process while achieving comprehensive correction accuracy.
Data Source
AI summary
A measuring instrument comprising a stylus displaced following a work, the instrument further comprises a corrector for correcting a displacement in the translation axis direction value according to a height detection axis direction value of the stylus position in a plane specified by the height detection axis and the translation axis, the corrector comprising a calibration measuring device that obtains the calibration measurement data including the displacement information of the translation axis direction value corresponding to the height detection axis direction value of the stylus by moving the stylus; a correction parameter setting device that determines a correction parameter best suited for correcting the measurement error due to the vertical movement error of the stylus based on the displacement information of the stylus; and a measurement data correcting device that corrects a measurement data by using the correction parameter.