Sub-group Wear Leveling in Memory Sub-systems

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Solution Overview

Problem

Current memory sub-systems face premature failure due to uneven wear distribution across memory components, leading to increased SMU-move operations and reduced lifespan, as all write operations to a given SMU are counted, regardless of even distribution across sub-groups.

Innovation Solution

Implementing a media management component that maintains sub-group-level write counts and life write counts at a finer granularity, allowing SMU-move operations only when sub-group-level write counts reach a threshold, thereby reducing the frequency of SMU-move operations and extending the lifespan of memory components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If all write operations to a given SMU are counted regardless of distribution across sub-groups, then wear leveling can be implemented, but SMU-move operations occur too frequently causing premature failure

Engineering Contradiction:
Improvememory component lifespanVSAvoidSMU-move operation frequency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent segments the SMU into multiple sub-groups and maintains separate write counts for each sub-group rather than a single aggregate count. This segmentation allows the system to recognize when write operations are evenly distributed across sub-groups, preventing premature SMU-move operations and extending memory component lifespan while reducing unnecessary data migration operations.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If sub-group-level write counts are maintained, then wear distribution can be monitored more precisely, but processing overhead increases

Engineering Contradiction:
Improvewear distribution measurementVSAvoidprocessing power consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent applies local quality by monitoring write counts at the sub-group level rather than uniformly across the entire SMU. This localized measurement approach provides precise wear distribution information only where needed, enabling the system to make informed decisions about SMU-move operations without unnecessarily processing all write operations, thus balancing measurement precision with processing efficiency.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS11789861B2Wear leveling based on sub-group write counts in a memory sub-system
Publication Date: 2023.10.17 MICRON TECHNOLOGY INC
  • US11789861B2 patent drawing
  • US11789861B2 patent drawing
  • US11789861B2 patent drawing

AI summary

In an embodiment, a system includes a plurality of memory components that each include a plurality of management groups. Each management group includes a plurality of sub-groups. The system also includes a processing device that is operatively coupled with the plurality of memory components to perform wear-leveling operations that include maintaining a sub-group-level delta write count (DWC) for each of the sub-groups of each of the management groups of a memory component in the plurality of memory components. The wear-leveling operations also include determining, in connection with a write operation to a first sub-group of a first management group of the memory component, that a sub-group-level DWC for the first sub-group equals a management-group-move threshold, and responsively triggering a management-group-move operation from the first management group to a second management group of the memory component.