Sub-Pixel Response Time Measurement Using CCD Microscopy

The patent segments the measurement process into two stages: first capturing an overall image of the display screen to identify pixel locations, then capturing magnified images of specific sub-pixel areas using a microscope. This segmentation allows precise measurement of response time in areas less than a pixel size by focusing measurement resources on specific regions of interest rather than attempting to measure all areas simultaneously with a single sensor.

The patent transitions from a two-dimensional measurement approach (overall screen measurement) to a three-dimensional approach by introducing optical magnification through a microscope. This dimensional change enables the measurement system to access and measure sub-pixel areas that are otherwise too small to be resolved by conventional flat-panel measurement methods, effectively adding a magnification dimension to the measurement capability.

The patent performs preliminary action by first capturing an overall image of the display screen to identify the locations and boundaries of pixels and sub-pixel areas. This preliminary step creates a map that guides subsequent magnified measurements, allowing the system to automatically locate and measure specific sub-pixel regions without manual intervention, thus maintaining ease of operation while achieving high measurement precision.

The patent introduces an image processing unit as an intermediary between the imaging system and the measurement analysis. This intermediary automatically processes the captured images to identify pixel boundaries, calculate luminance values, and determine response times. The image processing unit bridges the gap between simple image capture and complex measurement analysis, maintaining operational simplicity while enabling precise sub-pixel measurements.