Sub-pixel Image Shifting Frequency Correction Electron Microscope

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Solution Overview

Problem

Existing image processing methods for scanning electron microscopes, such as those disclosed in Japanese Unexamined Patent Application Publication No. 2006-308471 and WO2010/070815, fail to maintain accurate length measurement values when shifting images by sub-pixel amounts, leading to image blur and decreased reproducibility due to changes in frequency characteristics caused by pixel interpolation filters.

Innovation Solution

An electron beam device and image processing method that includes a sub-pixel shift process using a pixel interpolation filter and a frequency correction process to maintain the frequency characteristic of the image, preventing changes in length measurement values, even when shifting by sub-pixel amounts, by employing a data processing unit and correction calculation processing unit within the electron microscope system.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If image shifting is performed using pixel interpolation filter for sub-pixel amounts, then image position accuracy is improved, but frequency characteristic changes causing length measurement value changes

Engineering Contradiction:
Improveimage position accuracyVSAvoidlength measurement value consistency
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent changes the parameters of the pixel interpolation filter by introducing correction coefficients that adjust the filter's frequency characteristics. By modifying the filter parameters based on the shift amount, the system maintains consistent frequency characteristics across different shift operations, preventing length measurement value changes while achieving accurate sub-pixel positioning.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements a feedback mechanism where the actual frequency characteristics of the pixel interpolation filter are measured and used to calculate correction coefficients. These correction coefficients are then applied to adjust the filter in subsequent operations, creating a closed-loop system that maintains measurement consistency.

Inventive Principle:
Principle #23Feedback

2Manufacturing precision

If pixel interpolation filter is used for sub-pixel shifting, then image shifting precision is improved, but frequency characteristic degradation occurs

Engineering Contradiction:
Improveimage shifting precisionVSAvoidfrequency characteristic stability
Core Design Contradiction:
Manufacturing precisionVSStability of the object's composition

Solution Approach 1:

The patent modifies the parameters of the pixel interpolation filter by introducing correction coefficients that compensate for frequency characteristic degradation. The correction coefficients are calculated based on the relationship between shift amounts and frequency characteristics, allowing the filter to maintain stable frequency characteristics even when performing sub-pixel shifting operations.

Inventive Principle:
Principle #35Parameter changes

3Ease of operation

If image shifting is performed by integer pixel amounts, then processing simplicity is maintained, but sub-pixel positioning accuracy cannot be achieved

Engineering Contradiction:
Improveprocessing simplicityVSAvoidpositioning accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent segments the image shifting operation into two distinct stages: first, an integer pixel shift that maintains processing simplicity; second, a sub-pixel shift using a corrected pixel interpolation filter that achieves high positioning accuracy. This segmentation allows the system to benefit from both simplicity and precision without compromising either.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution ensures accurate and reproducible length measurements by stabilizing the frequency characteristic of images after shifting, thereby preventing changes in length measurement values and enhancing the precision and reliability of measurements, especially at high magnifications.

Implementation Method 1

emits an electron beam which has been finely throttled onto a specimen, detects two-dimensional electrons occurred by electron beam irradiation and reflected electrons

Methodology Applied
Scientific EffectElectron beam irradiation: Electron Beam

Implementation Method 2

detects two-dimensional electrons occurred by electron beam irradiation

Methodology Applied
Scientific EffectSecondary electron emission: Photoelectric Effect

Data Source

PatentUS11011346B2Electron beam device and image processing method
Publication Date: 2021.05.18 HITACHI HIGH TECH CORP
  • US11011346B2 patent drawing
  • US11011346B2 patent drawing
  • US11011346B2 patent drawing

AI summary

To acquire a correction image by performing a sub-pixel shift process for shifting an image using a pixel interpolation filter by a pixel shift amount between pixels and a frequency correction process for correcting a frequency characteristic of the image after shifted.