Sub-pixel Thermal Imaging via Micro Mirror Scanning Offsets

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Solution Overview

Problem

Conventional thermal imaging devices using micro mirror arrays have limited pixel resolution and low frame rates, which restrict their ability to accurately measure thermal radiation distribution at high resolutions.

Innovation Solution

The implementation of a scan mechanism that adjusts the relative position between the thermal image and the micro mirror array to sub-pixel offsets, combined with an optical system using CMOS or CCD image sensors, allows for the measurement of thermal radiation intensity at resolutions higher than the micro mirror array by calculating the rotation of micro mirrors, thereby generating a high-resolution thermal image output.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a micro mirror array is used for thermal imaging, then the device can measure thermal radiation distribution, but the pixel resolution is limited by the physical size of the micro mirrors

Engineering Contradiction:
Improvethermal radiation measurement precisionVSAvoidpixel resolution
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent divides each micro mirror's measurement function into multiple sub-pixel measurements by scanning the thermal image across the micro mirror surface at multiple offset positions. This segmentation allows the single micro mirror to effectively resolve thermal radiation distribution at a resolution higher than the micro mirror's physical pixel size, overcoming the limitation where measurement precision is constrained by manufacturing precision of the micro mirror array.

Inventive Principle:
Principle #1Segmentation

2Manufacturing precision

If the micro mirror array size is increased to improve resolution, then more thermal radiation pixels can be measured, but the frame rate decreases due to the sequential scanning requirement

Engineering Contradiction:
Improveoutput resolutionVSAvoidframe rate
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent employs periodic scanning action where the thermal image is rapidly scanned across the micro mirror array at multiple predetermined offset positions in a sequential manner. This periodic scanning allows the system to accumulate high-resolution measurement data from multiple passes, achieving high output resolution while maintaining operational productivity through efficient use of the micro mirror array's rotational measurement capability at each position.

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the generation of thermal images with resolutions up to several times higher than the micro mirror array's native resolution, improving the accuracy and detail of thermal radiation distribution measurements.

Implementation Method 1

A micro mirror configured as an imaging pixel can convert the intensity of thermal radiation incident on its radiation absorption surface into an angle of rotation of the micro mirror

Methodology Applied
Scientific EffectThermal radiation absorption and rotation conversion: Bi-Metallic Strip

Implementation Method 2

An optical system can be configured to use an optical image sensor to measure the rotation through imaging the position change of a light spot reflected off the micro mirror

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS12058453B2Thermal imaging with scanning at sub-pixel levels
Publication Date: 2024.08.06 CALUMINO PTY LTD
  • US12058453B2 patent drawing
  • US12058453B2 patent drawing
  • US12058453B2 patent drawing

AI summary

A thermal imaging device having a scan mechanism operable to effectuate sequentially predetermined offsets, each configured between a thermal image of thermal radiations in a defined area on an imaging plane and an array of micro mirrors configured on a substrate. A respective image of a light pattern of a light beam reflected by a light reflection portion of each respective micro mirror in the array can be captured, when a rotation of the respective micro mirror, caused by radiation incident on a radiation absorption surface of the respective micro mirror, is stabilized at a respective offset. After computing a respective measurement of intensity measured by the respective micro mirror based on the respective image captured for the respective offset, a processor computes measurements of intensity of radiation in sub-areas of the thermal image, from measurements of intensity for the predetermined offsets, to generate a high resolution output.