Substrate Alignment via Transfer Unit Offset for Sensor Range Limits
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Solution Overview
Problem
Substrate misalignment exceeding the accommodation range of a centering buffer unit leads to process defects and reduced alignment accuracy during semiconductor manufacturing, requiring manual intervention and increased alignment time.
Innovation Solution
A substrate treating apparatus and method that includes a transfer unit with location sensors to measure and correct substrate misalignment, temporarily offsetting the transfer unit's hand by a preset interval to align the substrate within the sensor reading range, using a substrate alignment unit with alignment pins to ensure precise positioning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the accommodation range of the centering buffer unit is increased to handle substrates exceeding the sensor reading range, then the substrate alignment capability is improved, but the device complexity and alignment time increase
Solution Approach 1:
The alignment process is segmented into two distinct stages: (1) a first alignment operation using the centering buffer unit for substrates within its accommodation range, and (2) a second alignment operation using the substrate alignment unit for substrates exceeding the centering buffer unit's range. This segmentation allows each unit to be optimized for its specific function, resolving the contradiction by handling different substrate cases differently rather than requiring one complex system to handle all cases.
Solution Approach 2:
The centering buffer unit performs a preliminary alignment operation to bring the substrate within the sensor reading range before the main alignment operation is performed by the substrate alignment unit. This preliminary action enables the subsequent precise alignment to be performed efficiently, avoiding the need for the substrate alignment unit to handle gross misalignments directly.
2Adaptability or versatility
If the accommodation range of the centering buffer unit is increased to handle substrates exceeding the sensor reading range, then the substrate alignment capability is improved, but the alignment time increases
Solution Approach 1:
The alignment process is segmented into two distinct stages: (1) a first alignment operation using the centering buffer unit for substrates within its accommodation range, and (2) a second alignment operation using the substrate alignment unit for substrates exceeding the centering buffer unit's range. This segmentation allows each unit to be optimized for its specific function, resolving the contradiction by handling different substrate cases differently rather than requiring one complex system to handle all cases.
Solution Approach 2:
The centering buffer unit performs a preliminary alignment operation to bring the substrate within the sensor reading range before the main alignment operation is performed by the substrate alignment unit. This preliminary action enables the subsequent precise alignment to be performed efficiently, avoiding the need for the substrate alignment unit to handle gross misalignments directly.
3Adaptability or versatility
If manual intervention is used to move substrates to a central location when misalignment exceeds the centering buffer unit range, then the substrate alignment capability is improved, but the productivity decreases
Solution Approach 1:
The substrate alignment unit automatically performs the alignment function that would otherwise require manual intervention. The control unit coordinates the transfer unit and substrate alignment unit to autonomously handle substrates exceeding the centering buffer unit's range, eliminating the need for operator intervention and maintaining high productivity while expanding alignment capability.
Data Source
AI summary
A substrate treating method includes measuring an alignment state of a substrate placed on a hand of a transfer unit that transfers the substrate, transferring the substrate to a substrate alignment unit by the transfer unit when the alignment state of the substrate is faulty, aligning a location of the substrate by the substrate alignment unit, and temporarily correcting the location of the substrate before the substrate is loaded on the substrate alignment unit when it is measured in the measuring of the alignment state that the alignment state of the substrate exceeds a sensor reading range.


