Rotating Substrate Support Bearing Temperature Feedback

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Solution Overview

Problem

Semiconductor substrate processing apparatuses face challenges in ensuring uniform temperature distribution across stacked substrates due to non-uniform process gas exposure and heater-induced temperature variations, which can lead to bearing malfunctions.

Innovation Solution

Incorporation of a temperature sensor to measure the bearing temperature, coupled with an alarm system to prevent overheating and facilitate timely maintenance, ensuring uniform substrate temperature and reducing bearing malfunctions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the substrate support is rotated to average out non-uniformities in process gas flows and heater-induced temperature variations, then within-substrate temperature uniformity is improved, but the bearing facilitating rotation may overheat and malfunction

Engineering Contradiction:
Improvewithin-substrate temperature uniformityVSAvoidbearing reliability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

A temperature sensor is integrated into the bearing to provide real-time temperature feedback. This feedback mechanism allows the system to monitor bearing temperature and trigger cooling or alarm mechanisms before overheating causes malfunction, thus resolving the contradiction between maintaining rotation for temperature uniformity and preventing bearing overheating

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The temperature sensor acts as an intermediary between the bearing and the control system. It detects temperature changes and transmits this information to the control system, which then takes appropriate actions (cooling or alarming) to prevent bearing failure while maintaining the rotational function needed for substrate temperature uniformity

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If the rotation speed is increased to improve temperature uniformity more quickly, then processing efficiency is improved, but the bearing is more likely to overheat and fail

Engineering Contradiction:
Improveprocessing efficiencyVSAvoidbearing reliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The temperature sensor provides continuous feedback on bearing temperature during rotation. This allows the control system to adjust rotation speed dynamically - increasing it when bearing temperature is acceptable (improving productivity) and reducing it or pausing when temperature approaches critical levels (maintaining reliability)

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances within-substrate temperature uniformity and reduces the risk of bearing failure by monitoring and addressing overheating, thereby improving processing consistency.

Implementation Method 1

The substrate support assembly may be provided with a temperature sensor constructed and arranged to measure the temperature of the bearing

Methodology Applied
Scientific EffectTemperature sensing: Thermocouple

Implementation Method 2

a heater to heat the reaction chamber

Methodology Applied
Scientific EffectJoule heating: Joule Heating

Data Source

PatentUS12412762B2Semiconductor substrate processing apparatus with a temperature sensor to measure the temperature of a bearing
Publication Date: 2025.09.09 ASM IP HLDG BV
  • US12412762B2 patent drawing
  • US12412762B2 patent drawing

AI summary

A semiconductor substrate processing apparatus is provided with a reaction chamber; a heater to heat the reaction chamber; and a substrate support assembly. The substrate support assembly comprising: a substrate support defining an outer support surface for supporting a substrate or substrate carrier in the reaction chamber; and a base assembly including a door for sealing the reaction chamber of the apparatus. The substrate support being connected to the base assembly through a bearing that facilitates rotation of the substrate support. The substrate support assembly is provided with a temperature sensor to measure the temperature of the bearing.