Semiconductor Substrate Bonding With Dual Adhesive Thickness Control

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing semiconductor manufacturing processes face issues with insulating substrate warpage and misalignment due to bending forces, leading to cracks and reduced thermal resistance.

Innovation Solution

A method involving the application of a hot melt adhesive with a specific film thickness followed by a thermosetting adhesive, ensuring parallelism and uniform contact by adjusting adhesive thickness through heating steps.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Stability of the object's composition

If the case and case fitting jig are fastened to each other, then the insulating substrate and case are temporarily fixed, but a bending force causing warpage is applied and cracks may form in the insulating layer

Engineering Contradiction:
Improvetemporary fixing stabilityVSAvoidinsulating layer integrity
Core Design Contradiction:
Stability of the object's compositionVSStrength

Solution Approach 1:

A protruding spacer is placed on the case fitting jig before the insulating substrate is attached. This spacer pre-establishes the correct thickness and positioning, ensuring that when the case is fastened to the jig, the insulating substrate is held at the proper distance without excessive bending force, thus preventing cracks in the insulating layer.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The protruding spacer acts as an intermediary element between the case fitting jig and the insulating substrate. It mediates the mechanical interaction by providing a controlled thickness barrier that distributes the fastening force evenly, preventing direct transmission of bending forces that would cause warpage and cracking.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Adaptability or versatility

If dimensional variations of members are present, then the insulating substrate may be fixed in an inclined state, but this causes cracking at joining or reduced thermal resistance

Engineering Contradiction:
Improvedimensional variation toleranceVSAvoidjoining reliability and thermal contact
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The protruding spacer provides localized thickness control at critical contact points between the insulating substrate and the case fitting jig. By concentrating the thickness-maintaining function at these specific locations, the spacer ensures proper alignment and prevents inclined fixing even when other parts of the assembly have dimensional variations, thereby maintaining reliable thermal contact.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The invention controls the thickness parameter of the adhesive layer by using a protruding spacer with a predetermined thickness. This fixed thickness parameter compensates for dimensional variations in the members, ensuring that the insulating substrate remains parallel to the case bottom surface during joining, thus preventing cracking and maintaining thermal resistance.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Prevents insulating substrate misalignment and maintains parallelism between the case and substrate, reducing stress concentration and potential cracking.

Implementation Method 1

a hot melt adhesive having a film thickness L1 is applied to an upper surface of the peripheral edge portion of the insulating substrate

Methodology Applied
Scientific EffectMelting: Melting

Implementation Method 2

the temporarily fixed insulating substrate and the case are heated to fix the insulating substrate and the case

Methodology Applied
Scientific EffectCooling: Cooling

Implementation Method 3

a thermosetting adhesive having a film thickness L2 is applied to a periphery of a region to which the hot melt adhesive is applied

Methodology Applied
Scientific EffectThermal curing: Heat Treatment

Data Source

PatentUS20250357147A1Method of manufacturing semiconductor device
Publication Date: 2025.11.20 MITSUBISHI ELECTRIC CORP
  • US20250357147A1 patent drawing
  • US20250357147A1 patent drawing
  • US20250357147A1 patent drawing

AI summary

A method of manufacturing the semiconductor device includes: the application step of applying the hot melt adhesive having the film thickness L1 to the upper surface of the peripheral edge portion of the insulating substrate, and then applying the thermosetting adhesive having the film thickness L2 to the periphery of the region to which the hot melt adhesive is applied on the upper surface of the peripheral edge portion of the insulating substrate; the temporary fixing step of temporarily fixing the insulating substrate and the case by fastening the case and the case fitting jig with screws; and the heating step of heating the temporarily fixed insulating substrate and the case to fix the insulating substrate and the case. L1>L2 in the temporary fixing step, and L1=L2 in the heating step.