Electrostatic Substrate Carrier with Conductive Drainage Elements

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Solution Overview

Problem

Existing substrate support systems in low-pressure ion implantation processes face mechanical unsatisfaction due to limited surface area for implanting current, leading to potential pin melting and substrate contamination, especially under pulsed bias voltage conditions.

Innovation Solution

The support system includes an electrically conductive biased table, an insulating electrostatic substrate carrier with a bearing plane, and a conductive clamping collar, featuring conductive elements such as strips and electrodes to increase the surface area for electrical contact and current drainage, potentially replacing or reconfiguring existing electrodes for improved current handling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a small number of electrodes are used for electrostatic clamping, then the device complexity is reduced, but the surface area for implanting current drainage is insufficient

Engineering Contradiction:
Improvenumber of electrodesVSAvoidcurrent drainage capability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The invention transitions from point-contact electrodes to a continuous planar contact surface. The bearing plane extends the contact area from discrete electrode points to a two-dimensional surface, enabling distributed current drainage across the entire substrate backside area while maintaining mechanical simplicity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The invention replaces the electrical contact mechanism (electrodes) with a mechanical contact surface (bearing plane). Instead of using electrical fields for clamping and current drainage, the system uses direct mechanical contact between the substrate and the bearing plane, eliminating the need for complex electrode systems.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Manufacturing precision

If pulsed bias voltage is applied for ion implantation, then the implantation precision is improved, but the risk of pin melting and substrate contamination increases

Engineering Contradiction:
Improveimplantation precisionVSAvoidpin melting and contamination
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The invention extracts the harmful concentration effect from the system by removing the discrete electrodes that caused current density peaks. By replacing point-contact electrodes with a distributed planar contact surface, the system eliminates the localized heat generation that led to pin melting while preserving the pulsed bias voltage benefits for implantation precision.

Inventive Principle:
Principle #2Taking out (Extraction)

3Device complexity

If the substrate is held solely at the periphery of the substrate carrier, then the device complexity is reduced, but the mechanical stability is insufficient

Engineering Contradiction:
Improvesubstrate holding structureVSAvoidmechanical stability
Core Design Contradiction:
Device complexityVSStability of the object's composition

Solution Approach 1:

The invention extends the support contact from a one-dimensional periphery ring to a two-dimensional bearing plane. This planar contact surface distributes the mechanical load across the entire substrate backside area, providing superior mechanical stability while maintaining a simple structural design without additional complex holding mechanisms.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances the surface area for implanting current drainage, reducing the risk of pin melting and substrate contamination, while maintaining effective electrical and thermal contact, thus improving the mechanical stability and efficiency of the ion implantation process.

Implementation Method 1

an insulating electrostatic substrate carrier in the form of a cylinder having a shoulder, the bottom face of the substrate carrier facing the biased table

Methodology Applied
Scientific EffectElectrostatic force: Electrostatics

Implementation Method 2

the support also includes at least one electrically conductive element for connecting the bearing plane to the shoulder

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 3

immersing the substrate in a plasma and in biasing it with a negative voltage lying in the range several tens of volts to several tens of kilovolts (generally less than 100 kV), for the purpose of creating an electric field capable of accelerating the ions of the plasma towards the substrate

Methodology Applied
Scientific EffectElectric field acceleration: Electric Field

Implementation Method 4

implanting ions in a substrate consists in immersing the substrate in a plasma and in biasing it with a negative voltage

Methodology Applied
Scientific EffectIon implantation: Ion Implantation

Implementation Method 5

The space that exists between the substrate and the substrate carrier is filled with a refrigerating gas

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS11053582B2Support including an electrostatic substrate carrier
Publication Date: 2021.07.06 ION BEAM SERVICES
  • US11053582B2 patent drawing
  • US11053582B2 patent drawing

AI summary

The present invention provides a support that comprises:an electrically conductive biased table;an insulating electrostatic substrate carrier 20 in the form of a cylinder having a shoulder 21, the bottom face of the substrate carrier 20 facing the biased table and its top face 22 presenting a bearing plane designed to receive a substrate; andan electrically conductive clamping collar for clamping the shoulder 21 against the biased table.The support also has at least one electrically conductive element 201-202-203 for connecting the bearing plane to the shoulder 211.