Substrate Chamber Exhaust Layout for High-Rate Film Deposition

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Solution Overview

Problem

Existing substrate processing apparatuses face challenges in maintaining high film-forming rates while minimizing the formation of organic films on inner container walls, leading to reduced throughput due to frequent cleaning needs.

Innovation Solution

The apparatus incorporates a stage with a ring cover and exhaust paths of varying conductances to manage gas flows, ensuring efficient exhaustion of purge and processing gases, thereby reducing film-forming gas concentration in non-processing areas and minimizing organic film deposition.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If purge gas is supplied into the lower space to prevent film deposition on inner walls, then film deposition on inner walls is suppressed, but film-forming rate on substrates is reduced

Engineering Contradiction:
Improvefilm deposition on inner wallsVSAvoidfilm-forming rate on substrates
Core Design Contradiction:
Object-affected harmful factorsVSProductivity

Solution Approach 1:

The exhaust system is segmented into multiple independent paths: a first exhaust path for the processing space and a second exhaust path for the lower space. This segmentation allows separate control of gas flow in each region, enabling purge gas to be supplied to the lower space without significantly affecting the processing space where film formation occurs, thus resolving the contradiction between preventing wall deposition and maintaining film-forming rate

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The first exhaust path acts as an intermediary barrier between the lower space and the processing space. By providing a dedicated exhaust path with lower conductance for the processing space, the system mediates the gas flow so that purge gas supplied to the lower space is efficiently removed without大量 diffusing into the processing space, thereby preventing wall deposition while maintaining film-forming rate

Inventive Principle:
Principle #24Intermediary (Mediator)

2Loss of time

If purge gas flow rate is increased to suppress film deposition on inner walls, then cleaning frequency is reduced, but film-forming gas concentration in processing space is reduced

Engineering Contradiction:
Improvecleaning frequencyVSAvoidfilm-forming gas concentration in processing space
Core Design Contradiction:
Loss of timeVSQuantity of substance

Solution Approach 1:

The exhaust system is divided into separate paths for the processing space and lower space, allowing independent control of gas flow rates. The second exhaust path can be optimized to handle higher purge gas flow rates without affecting the gas concentration in the processing space, enabling reduced cleaning frequency while maintaining film-forming rate

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The conductance of the first exhaust path is specifically designed to be lower than that of the processing space, creating a parameter difference that controls gas flow distribution. This parameter optimization allows the system to accommodate higher purge gas flow rates in the lower space while maintaining appropriate film-forming gas concentration in the processing space

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration maintains high film-forming rates by suppressing organic film formation on inner walls, reducing cleaning frequency, and enhancing overall processing throughput.

Implementation Method 1

a first exhaust path provided between a processing space above the stage and the exhaust space and having a smaller conductance than the processing space; and a second exhaust path provided between a lower space below the stage and the exhaust space and having a smaller conductance than the processing space

Methodology Applied
Scientific EffectGas flow control through conductance difference:

Implementation Method 2

forms an organic film of a polymer on the substrate by a polymerization reaction between the two types of monomers

Methodology Applied
Scientific EffectPolymerization reaction:

Implementation Method 3

forming an organic film of a polymer on a substrate by a vacuum deposition polymerization reaction

Methodology Applied
Scientific EffectVacuum deposition:

Data Source

PatentUS12620565B2Substrate processing apparatus
Publication Date: 2026.05.05 TOKYO ELECTRON LTD
  • US12620565B2 patent drawing
  • US12620565B2 patent drawing
  • US12620565B2 patent drawing

AI summary

A substrate processing apparatus includes: a processing container; a stage provided in an interior of the processing container to place a substrate on the stage; an exhaust space arranged around the stage along an inner wall of the processing container; a first exhaust path provided between a processing space above the stage and the exhaust space and having a smaller conductance than the processing space; and a second exhaust path provided between a lower space below the stage and the exhaust space and having a smaller conductance than the processing space. A processing gas supplied into the processing space is exhausted via the first exhaust path, a purge gas supplied into the lower space is exhausted via the second exhaust path, and the second exhaust path is connected to the first exhaust path or to a space that is closer to the exhaust space than the first exhaust path.