Substrate Processing Controller Abnormality Correction

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Solution Overview

Problem

In substrate processing apparatuses, the detection of abnormalities in processing units leads to delays in restoration due to the absence of operators, particularly in unmanned factories, resulting in a deterioration of operation rates.

Innovation Solution

A substrate processing apparatus with a controller that shifts processing units with detected abnormalities to a monitor mode and executes improvement processing based on correlated abnormality detection and improvement processing information, enabling autonomous correction and preventing further substrate processing until the issue is resolved.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If substrate processing is performed in multiple processing units, then productivity is improved, but reliability deteriorates due to undetected abnormalities affecting operation rates

Engineering Contradiction:
Improveoperation rateVSAvoidabnormality detection accuracy
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system implements a feedback mechanism where substrate surface measurement results are fed back to the controller, which then notifies operators of abnormalities in processing units. This closed-loop feedback ensures that abnormalities are detected and communicated systematically, improving reliability while maintaining high productivity across multiple processing units.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

A database is introduced as an intermediary component that stores and manages the correlation between abnormality types and processing units. The controller queries this database to retrieve accurate abnormality information, ensuring reliable detection and notification without directly complex interactions between measurement systems and operator interfaces.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If manual abnormality checking is performed, then measurement precision is improved, but loss of time increases due to operator absence in unmanned factories

Engineering Contradiction:
Improveabnormality detection accuracyVSAvoidrestoration delay
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system performs self-service by automatically measuring substrate surfaces, detecting abnormalities, and notifying operators without requiring continuous manual inspection. The processing units autonomously execute substrate processing while the controller autonomously monitors for abnormalities, eliminating restoration delays caused by operator absence while maintaining detection accuracy.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The substrate surface measurement and abnormality detection operate continuously during substrate processing in each processing unit. Rather than periodic manual checks, the system maintains continuous monitoring, ensuring abnormalities are detected immediately and operators are notified without delay, preserving both precision and time efficiency.

Inventive Principle:
Principle #20Continuity of useful action

3Reliability

If operator notification is implemented upon abnormality detection, then reliability is improved, but loss of time increases due to delayed operator arrival in unmanned environments

Engineering Contradiction:
Improveabnormality notification accuracyVSAvoidoperator response time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system performs preliminary action by pre-establishing a database that correlates abnormality types with specific processing units and pre-configuring automatic notification protocols. When an abnormality is detected, the controller immediately queries the database and notifies the appropriate operator without delay, ensuring both accurate notification and rapid response even in unmanned factory environments.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10474139B2Substrate processing apparatus and substrate processing method
Publication Date: 2019.11.12 TOKYO ELECTRON LTD
  • US10474139B2 patent drawing
  • US10474139B2 patent drawing
  • US10474139B2 patent drawing

AI summary

Disclosed is substrate processing apparatus including a plurality of processing units, each of which processes a substrate, and a controller that causes each of the processing units to execute a substrate processing. The controller is configured to cause a processing unit with a detected abnormality to execute an improvement processing based on abnormality detection information including a content of abnormality detected by a substrate surface measurement after causing the substrate processing to be performed in each of the processing units. The improvement processing is specified from improvement processing information in which the content of abnormality and the improvement processing are correlated with each other.