Substrate Film Deposition Sequence for Halogen By-Product Removal

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Solution Overview

Problem

The deposition rate in the process of forming a film on a substrate during semiconductor device manufacturing is often hindered by the accumulation of halogen-based by-products, which inhibit the reaction between precursor gases and the substrate surface.

Innovation Solution

A method involving the consecutive supply of specific gas sequences, including a halogen-containing gas, a reducing gas, and inert gases, to form a film containing a first and second element, where the halogen-containing gas and a fourth reducing gas are supplied consecutively, and the second and third reducing gases are supplied consecutively, to reduce by-product accumulation and enhance deposition efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional film formation process is used, then film can be formed on substrate, but deposition rate decreases due to halogen by-product accumulation

Engineering Contradiction:
Improvedeposition rateVSAvoidhalogen by-product accumulation
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

A reducing gas is supplied before the precursor gas to pre-react with and remove halogen by-products from the substrate surface. This preliminary action prevents by-product accumulation that would otherwise inhibit subsequent deposition reactions, thereby maintaining high deposition rates throughout the film formation process.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The halogen by-products, which are harmful to deposition rate, are converted into beneficial reactions by introducing a reducing gas. The reducing gas reacts with the halogen by-products to form volatile compounds that can be easily removed, transforming the harmful accumulation into a useful cleaning mechanism that enhances overall deposition efficiency.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Productivity

If multiple gases are supplied in sequence, then deposition rate improves, but process complexity increases

Engineering Contradiction:
Improvedeposition rateVSAvoidgas supply process complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The film formation process is segmented into distinct stages: a first gas supply stage with reducing gas before precursor gas to remove by-products, and a second gas supply stage with precursor gas for actual film deposition. This segmentation allows each stage to be optimized independently while maintaining overall process simplicity through clear temporal separation of functions.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach improves the deposition rate by reducing the time for by-product reaction and adsorption on the substrate surface, leading to better film quality and electrical resistance characteristics.

Implementation Method 1

supplying a first gas containing a first element and a halogen element to the substrate

Methodology Applied
Scientific EffectChemical Vapour Deposition: Chemical Vapour Deposition

Implementation Method 2

supplying a third gas containing a third element and having a reducing character to the substrate; supplying a fourth gas containing a fourth element and having a reducing character to the substrate

Methodology Applied
Scientific EffectReduction: Reduction

Data Source

PatentEP4464818A1Method of processing substrate, method of manufacturing semiconductor device, substrate processing apparatus, and program
Publication Date: 2024.11.20 KOKUSAI DENKI KK
  • EP4464818A1 patent drawingFigure 1
  • EP4464818A1 patent drawingFigure 2
  • EP4464818A1 patent drawingFigure 3

AI summary

A technique includes forming a film containing a first element and a second element different from the first element on a substrate (200) by performing a process a predetermined number of times, the process including: (a) supplying a first gas containing the first element and a halogen element to the substrate (200); (b) supplying a second gas containing the second element to the substrate (200); (c) supplying a third gas containing a third element and having a reducing character to the substrate (200); and (d) supplying a fourth gas containing a fourth element and having a reducing character to the substrate (200), wherein (a) and (d) are performed consecutively, and (b) and (c) are performed consecutively.