Substrate Film Deposition Sequencing for Deep Groove Step Coverage

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Solution Overview

Problem

The increasing aspect ratio of grooves on substrates in 3D NAND structures poses a challenge for achieving effective step coverage performance during film formation, necessitating improved gas supply to the bottom of these structures.

Innovation Solution

A method involving sequential supply of a precursor gas containing a first element and halogen, followed by a first reducing gas, then a second reducing gas, with specific timing and sequencing to form a film on the substrate, including starting the first reducing gas during precursor gas supply and continuing after precursor gas cessation without purging, and finally applying the second reducing gas.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional film formation methods are used, then the process is simple, but the step coverage performance deteriorates in deep grooves

Engineering Contradiction:
Improvestep coverage performanceVSAvoidgas supply process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The gas supply process is segmented into multiple distinct phases: precursor gas supply, first reducing gas supply, second reducing gas supply, and purge gas supply. Each phase serves a specific function in achieving uniform step coverage, with the precursor gas providing material, the reducing gases facilitating reaction and coverage, and the purge gas removing excess materials.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs periodic, sequential gas supply actions rather than continuous supply. The gas supply is divided into repeated cycles of precursor gas, first reducing gas, second reducing gas, and purge gas, where each gas type is supplied in a specific sequence and timing pattern to achieve uniform deposition throughout the groove structure.

Inventive Principle:
Principle #19Periodic action

2Manufacturing precision

If gas is supplied continuously, then the process is simple, but the film coverage becomes non-uniform in deep grooves

Engineering Contradiction:
Improvefilm coverage uniformityVSAvoidprocessing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The precursor gas is supplied in a preliminary phase before the reducing gases to pre-deposit material on the substrate surface and in grooves. This preliminary action ensures that material is available before the reducing gases arrive, facilitating uniform coverage. The timing is controlled so that the precursor gas supply ends just as the first reducing gas supply begins, optimizing the sequence.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent maintains continuous useful action by ensuring that one gas supply phase always begins as the previous phase ends, with no idle time between gas supply steps. The precursor gas supply ends exactly when the first reducing gas supply begins, and this continues through all phases, maintaining uninterrupted film formation activity throughout the process.

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enhances the step coverage performance of films on substrates by improving the continuity and coverage of the formed film, particularly in deep grooves, thereby enhancing the manufacturing process efficiency.

Implementation Method 1

supplying a precursor gas containing a first element and halogen to a substrate; supplying a first reducing gas to the substrate; supplying a second reducing gas to the substrate; forming a film containing the first element on the substrate

Methodology Applied
Scientific EffectChemical Vapour Deposition: Chemical Vapour Deposition

Data Source

PatentUS20250389026A1Method of processing substrate, method of manufacturing semiconductor device, substrate processing apparatus, and recording medium
Publication Date: 2025.12.25 KOKUSAI DENKI KK
  • US20250389026A1 patent drawing
  • US20250389026A1 patent drawing
  • US20250389026A1 patent drawing

AI summary

There is provided a technique that includes (a) supplying a precursor gas containing a first element and halogen to a substrate; (b) supplying a first reducing gas to the substrate; (c) supplying a second reducing gas to the substrate; and (d) supplying the precursor gas to the substrate, wherein the technique further includes: (e) starting (b) during (a) and ending (a) during (b); (f) performing (d) after (e) without purging between (e) and (d); (g) performing (c) after (f); and (h) forming a film containing the first element on the substrate by performing (e), (f), and (g) sequentially in this order a predetermined number of times.