Multilayer Substrate Edge Delamination Prevention

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Solution Overview

Problem

The existing processes for bonding and transferring layers in multilayer substrates often result in peripheral delamination and irregular circumferences due to low bonding energy at the edges, exacerbated by thermomechanical stresses, particularly when materials cannot withstand high temperatures, leading to contamination risks.

Innovation Solution

A process involving molecular adhesion bonding, heat treatment for consolidation, annular trimming, and chemical etching to ensure a clean edge and smooth surface, using TMAH solution for selective etching to prevent delamination and contamination, with optional grinding steps before or after trimming.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If molecular adhesion bonding is used to bond donor and receiver substrates, then the bonding process can be implemented at low temperatures suitable for temperature-sensitive materials, but the bonding energy at the edges is insufficient leading to peripheral delamination

Engineering Contradiction:
Improvebonding temperatureVSAvoidbonding strength at edges
Core Design Contradiction:
TemperatureVSReliability

Solution Approach 1:

The patent applies a preliminary action by performing a first trimming step on the donor substrate before bonding to remove potential defect zones at the periphery. This preventive measure addresses the inherent weakness of molecular adhesion at edges by eliminating the problematic regions beforehand, thus preventing delamination without requiring high bonding temperatures.

Inventive Principle:
Principle #10Preliminary action

2Shape

If mechanical trimming is performed on the bonded structure, then the periphery can be cleaned and regularized, but thermomechanical stresses cause localized or extended debonding of the bonding interface

Engineering Contradiction:
Improveperiphery regularityVSAvoidbonding interface integrity
Core Design Contradiction:
ShapeVSReliability

Solution Approach 1:

The patent segments the trimming operation into two distinct stages: a first trimming step performed on the donor substrate before bonding to remove defect zones, and a second trimming step performed after bonding to regularize the periphery. This segmentation allows each trimming operation to be optimized independently, reducing the risk of debonding that would occur with a single aggressive trimming step on the bonded structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The first trimming step constitutes a preliminary action that prepares the donor substrate by removing potential defect zones before bonding occurs. This preliminary preparation reduces the likelihood that subsequent mechanical trimming will cause debonding, as the most vulnerable regions have already been eliminated.

Inventive Principle:
Principle #10Preliminary action

3Manufacturing precision

If the donor substrate is thinned by grinding or polishing, then the transferred layer can be formed, but peripheral partial delamination occurs at the bonding interface

Engineering Contradiction:
Improvetransferred layer thicknessVSAvoidadhesion at bonding interface
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent performs preliminary trimming of the donor substrate before bonding to remove defect zones at the periphery. This preliminary action prevents the initiation of delamination during subsequent thinning operations, allowing the donor substrate to be thinned by grinding or polishing without causing peripheral partial delamination of the transferred layer.

Inventive Principle:
Principle #10Preliminary action

4Ease of manufacture

If chamfers are present on donor and receiver substrates, then the substrates can be commonly available and easy to manufacture, but bonding energy around the edges is reduced leading to poor adhesion

Engineering Contradiction:
Improvesubstrate availabilityVSAvoidedge adhesion
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent extracts or removes the problematic peripheral regions with chamfers from the bonding interface through trimming operations. By removing these defect-prone zones before and after bonding, the negative effect of chamfers on edge adhesion is eliminated, allowing the use of commonly available substrates with chamfers without compromising bonding reliability.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This process prevents flaking and delamination, achieving a transferred layer with a regular circumference, reducing contamination risks and operational complexity while being cost-effective and applicable to temperature-sensitive materials.

Implementation Method 1

two substrates, respectively referred to as a 'donor substrate' and a 'receiver substrate,' are bonded to one another by molecular adhesion

Methodology Applied
Scientific EffectMolecular adhesion: Adhesive

Implementation Method 2

applying heat treatment to the aforementioned stack in order to consolidate the bonding interface

Methodology Applied
Scientific EffectHeat treatment: Heat Treatment

Implementation Method 3

carrying out a chemical etching step of the exposed surface of the remaining part of the donor substrate and of an exposed surface of the receiver substrate

Methodology Applied
Scientific EffectChemical etching: Chemical Bonding

Data Source

PatentUS8505197B2Methods of fabricating multilayer substrates
Publication Date: 2013.08.13 SOITEC SA
  • US8505197B2 patent drawing
  • US8505197B2 patent drawing
  • US8505197B2 patent drawing

AI summary

A method of fabricating a multilayer substrate may include bonding a front face of a donor substrate to a front face of a receiver substrate by molecular adhesion to form a stack and applying a heat treatment to the stack to consolidate a bond interface between the donor substrate and the receiver substrate. The method may further include thinning a back face of the donor substrate, trimming a periphery of the donor substrate and at least a portion of a periphery of the receiver substrate, and etching the back face of the donor substrate, the periphery of the donor substrate, and the at least a portion of the periphery of the receiver substrate subsequent to thinning the back face of the donor substrate and trimming the periphery of the donor substrate and the at least a portion of the periphery of the receiver substrate.