Substrate Exhaust Flow Control for Uniform Thin Film Profiles

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Solution Overview

Problem

In substrate processing, asymmetric exhaust structures lead to non-uniform thin film thickness and profile shifts, causing uneven film characteristics on substrates, particularly when the exhaust port is asymmetrically disposed.

Innovation Solution

A substrate processing apparatus with a flow control unit in the exhaust channel, featuring through holes and a movable design, is implemented to control gas flow and prevent concentration at the exhaust port, ensuring uniform gas distribution and minimizing turbulence.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If gas is exhausted from a portion of the reactor, then the exhaust structure is simplified, but the gas flow concentrates on that portion causing non-uniform film profile

Engineering Contradiction:
Improveexhaust structureVSAvoidfilm profile uniformity
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The exhaust unit is divided into multiple exhaust ports positioned at different locations (first exhaust port at front, second exhaust port at rear) rather than using a single centralized exhaust. This segmentation distributes the gas flow extraction across multiple points, preventing flow concentration and maintaining uniform film profiles while keeping each exhaust port relatively simple in structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The exhaust ports are positioned asymmetrically relative to the substrate center, with the first exhaust port located at the front portion and the second exhaust port at the rear portion. This asymmetric arrangement compensates for natural flow patterns and ensures balanced gas distribution across the substrate surface, achieving uniform film deposition despite the non-symmetric exhaust configuration.

Inventive Principle:
Principle #4Asymmetry

2Device complexity

If the exhaust port is disposed asymmetrically, then the exhaust structure is simplified, but the thin film thickness becomes non-uniform across the substrate

Engineering Contradiction:
Improveexhaust structureVSAvoidthin film thickness uniformity
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

Instead of using a single asymmetric exhaust port, the system employs multiple exhaust ports (first and second exhaust ports) positioned at different asymmetric locations. This segmentation allows each port to handle specific regional exhaust needs, collectively achieving uniform gas distribution and consistent film thickness across the entire substrate despite asymmetric positioning.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different exhaust ports are positioned to address local flow characteristics at different locations on the substrate. The first exhaust port at the front portion and the second exhaust port at the rear portion are strategically placed to create locally optimized gas flow patterns that collectively result in uniform film thickness across the entire substrate surface.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution achieves uniform thin film characteristics across substrates by mitigating exhaust deflection and turbulence, thereby improving the symmetry and uniformity of thin film profiles, even with asymmetric exhaust structures.

Implementation Method 1

a flow control unit disposed in an exhaust channel from a space inside the exhaust unit to the exhaust port

Methodology Applied
Scientific EffectGas flow control through porous structure: Porosity

Implementation Method 2

the flow control unit may be configured to prevent a gas flow in the exhaust space from concentrating at the exhaust port

Methodology Applied
Scientific EffectTurbulence reduction: Turbulence

Data Source

PatentUS11823876B2Substrate processing apparatus
Publication Date: 2023.11.21 ASM IP HLDG BV
  • US11823876B2 patent drawing
  • US11823876B2 patent drawing
  • US11823876B2 patent drawing

AI summary

A substrate processing apparatus capable of processing a thin film to have improved quality through uniform exhaustion includes: a substrate supporting unit; a processing unit on the substrate supporting unit; an exhaust unit connected to a reaction space between the substrate supporting unit and the processing unit; an exhaust port connected to at least a portion of the exhaust unit; and a flow control unit disposed in an exhaust channel from a space inside the exhaust unit to the exhaust port.