Substrate Height Measurement Using Contact Detection
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Solution Overview
Problem
Conventional mounting apparatuses for substrates incur increased costs due to dedicated sensors for height measurement, and laser displacement sensors can misrecognize substrate height due to reflections from electrodes or wiring.
Innovation Solution
A mounting apparatus that uses a lifting and lowering device to position a holding member, a contact detection section to sense contact with the substrate, and a control section to set the component's mounting height based on the holding member's position, allowing accurate substrate height measurement without additional dedicated sensors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a dedicated sensor is provided to measure the height of the substrate, then the measurement precision is improved, but the device complexity and cost increase
Solution Approach 1:
The holding member, originally designed solely to hold components, is given a dual function by using it as a measurement probe. The lifting and lowering device controls the holding member's vertical position, and the contact detection section detects when the holding member touches the substrate surface. This eliminates the need for a dedicated height measurement sensor, reducing device complexity while maintaining measurement capability.
Solution Approach 2:
The holding member serves itself by simultaneously performing its primary function of holding components and its secondary function of measuring substrate height. The system uses the holding member's own position and contact detection to acquire height information, rather than requiring a separate measurement system.
2Measurement precision
If a laser displacement sensor is used to measure substrate height, then the measurement precision is improved, but harmful factors (light reflection from electrodes or wiring) cause measurement errors
Solution Approach 1:
The patent replaces the optical measurement system (laser displacement sensor) with a mechanical contact-based measurement system. The holding member physically touches the substrate surface through the lifting and lowering device, and the contact detection section senses this mechanical contact. This mechanical approach eliminates all optical interference from reflections or scattering off substrate features.
Solution Approach 2:
The holding member acts as an intermediary between the measurement system and the substrate. Instead of using light that can be reflected or scattered, the holding member physically transfers the measurement function through mechanical contact, providing a reliable interface that is not affected by optical properties of the substrate.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate substrate height measurement without the costs associated with dedicated sensors and minimizes errors from light reflections, allowing for precise component placement.
Implementation Method 1
a contact detection section configured to detect contact between the holding member or a component held by the holding member and the substrate
Data Source
AI summary
A mounting apparatus includes a lifting and lowering device that lifts and lowers a holding member holding a component with respect to a substrate, a contact detection section that detects contact between the holding member or a component held by the holding member and the substrate, and a control section that sets a mounting height of the component in accordance with a height of the substrate, causes the holding member holding the component to be lowered to the mounting height by the lifting and lowering device, and releases holding of the component to mount the component when the contact is detected, in which the control section acquires a height of the holding member when the holding member is lowered by the lifting and lowering device and the contact is detected, and measures the height of the substrate based on the height of the holding member.