Substrate Inspection Apparatus Orientation Display
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Solution Overview
Problem
Existing substrate inspection methods struggle to accurately determine the mounted state of components, particularly when solder paste is insufficiently or excessively applied, and components are arranged in various directions, leading to confusion and difficulty in identifying issues through displayed images.
Innovation Solution
The substrate inspection apparatus displays components in both their reference direction and actual arrangement direction, allowing users to visually inspect and compare the mounted state by overlaying or displaying the difference as an angle, enabling clear identification of component orientations and eliminating confusion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If components are arranged in various directions on the substrate, then the design flexibility and functionality are improved, but the user's ability to accurately identify and inspect component orientations is worsened
Solution Approach 1:
The patent uses directional indicators (arrows) displayed on the inspection interface to show the reference direction and actual arrangement direction of components. These visual indicators change or vary to represent different orientation states, helping users quickly understand component directions without confusion despite various arrangement orientations on the substrate.
2Device complexity
If the inspection apparatus displays only the measured image of components, then the device complexity is reduced, but the measurement precision and inspection accuracy are worsened
Solution Approach 1:
The patent segments the inspection information into multiple visual elements: the measured image of the component, directional indicators showing reference direction, directional indicators showing actual arrangement direction, and angular difference indicators. This segmentation allows comprehensive inspection information to be displayed in an organized manner, improving measurement precision while keeping the interface manageable.
Solution Approach 2:
The patent adds directional information as an additional visual dimension overlaying the measured image. By displaying reference direction indicators and actual arrangement direction indicators simultaneously with the component image, the system provides multi-dimensional inspection data (position, orientation, angular difference) without requiring multiple separate displays, thus improving accuracy while controlling complexity.
3Measurement precision
If the apparatus provides detailed directional information for each component, then the inspection accuracy is improved, but the information processing complexity and display complexity increase
Solution Approach 1:
The patent calculates and stores the reference direction and actual arrangement direction information in advance during the measurement process. The control unit determines the reference direction based on component design data before inspection, and measures the actual arrangement direction during inspection. This preliminary preparation of directional data simplifies the display process and reduces real-time processing complexity while maintaining high measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows users to accurately determine the mounted state of components without confusion, even when components are arranged in various forms, by providing a clear visual representation of their orientation, facilitating precise inspection and reducing errors.
Implementation Method 1
a three-dimensional substrate measurement apparatus using the patterned light... photographing the object to be measured which is irradiated with the patterned light
Data Source
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AI summary
Disclosed are a substrate inspection apparatus and a method for displaying a component in a three-dimensional inspection of a substrate. The substrate inspection apparatus measures a substrate or an inspection target region of interest of the substrate and displays an image of components positioned within the measured region on a display unit. The image of the components displayed on the display unit may be displayed in a predetermined reference direction. The difference between the reference direction and a direction in which the actual component is disposed on the substrate is displayed in the form of a numerical value or a figure. Alternatively, the image of the component in the reference direction and the image of the actually disposed component are simultaneously displayed on a screen, and a user may convert a display method of the image by using a toggle button.