Reference Value Setting for Substrate Inspection
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Solution Overview
Problem
Conventional substrate inspection methods face challenges in setting reference values to minimize disagreements between intermediate and final process inspection results, leading to inefficiencies and a high burden on users due to reliance on trial-and-error methods.
Innovation Solution
A method and device for setting an optimum reference value by individually measuring target portions on substrates after an intermediate process, calculating the number of substrates with 'good' or 'no good' judgments, and adjusting the reference value to ensure the frequency of disagreement falls within a user-defined allowable range, using input means, memory, and output means to store and process measurement and judgment data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the same reference value is used for components of the same kind in intermediate process inspection, then teaching efficiency is improved, but inspection results may disagree with final process results
Solution Approach 1:
The patent applies local quality by setting different reference values for components based on their specific conditions (mounting density, position, component type) rather than using a uniform reference value for all components of the same kind. This allows the inspection system to account for local variations in soldering behavior and displacement patterns, improving the accuracy of inspection results while maintaining efficient automated inspection.
2Reliability
If different reference values are set for individual components, then inspection accuracy is improved, but setting complexity increases
Solution Approach 1:
The patent changes parameters by dynamically adjusting reference values based on measurable conditions such as mounting density, component position, and component type. The system automatically modifies reference values for displacement, solder amount, and other parameters according to the specific conditions of each component, improving inspection accuracy without requiring manual setting of complex reference values for each component.
Solution Approach 2:
The patent implements feedback by using final process inspection results to validate and adjust intermediate process reference values. The system compares intermediate inspection results with final inspection results and automatically refines reference values based on the agreement or disagreement between the two, reducing setting complexity while maintaining high accuracy.
3Ease of operation
If trial and error method is used to set reference value, then user burden is reduced, but time consumption increases
Solution Approach 1:
The patent applies preliminary action by pre-establishing reference value setting rules and algorithms that automatically determine appropriate reference values based on component conditions. The system performs preliminary calculations and adjustments based on mounting density, component type, and position data, eliminating the need for time-consuming trial and error methods while reducing user burden to simple parameter input and result verification.
Data Source
Figure 1~3
Figure 2
Figure 4~5B
AI summary
Where substrates with components are produced through a series of production processes and inspected after each of these production processes, a method is provided for setting an optimum reference value for making judgments in these inspections such that the frequency of occurrence of disagreement between inspection results after an intermediate process and after the final results will come to within a specified range. After an initial value is assigned for a reference value, this value is sequentially varied while repeating specified processes of saving measured and judgment data on inspected portions of components in a memory and setting a reference value by using the data saved in the memory until a specified condition becomes satisfied.