Substrate Inspection Program Allocation Using Suitability Scoring
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Solution Overview
Problem
Existing substrate inspection systems face inefficiencies and inaccuracies due to unpredictable factors like component states and inspection device conditions, which can lead to suboptimal allocation of inspection tasks across multiple devices.
Innovation Solution
An inspection system that includes imaging and inspection units capable of capturing and analyzing image data to calculate suitability scores for each inspection item, allowing for dynamic assignment of tasks based on actual conditions and past performance data, ensuring optimal allocation of inspections across devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If inspection items are allocated to inspection devices based on design information (component type and placement), then the inspection program can be systematically organized, but inspection accuracy and efficiency deteriorate due to unexpected factors like component state and device condition
Solution Approach 1:
The system performs preliminary actions by calculating inspection suitabilities in advance based on design information, component states, and device conditions. The suitability calculation unit computes suitability values for each inspection device before actual inspection allocation, allowing the system to pre-determine the optimal inspection device for each inspection item while accounting for various influencing factors.
Solution Approach 2:
The system changes parameters by dynamically adjusting inspection allocation based on suitability values. Instead of fixed allocation based solely on design information, the system varies the inspection device assignment according to calculated suitability parameters that reflect current component states and device conditions, thereby optimizing both accuracy and efficiency.
2Reliability
If multiple inspection devices are used to inspect all inspection items, then inspection coverage is improved, but redundant inspections occur reducing efficiency
Solution Approach 1:
The system applies local quality by assigning different inspection devices to different inspection items based on their specific suitability values. Each inspection item is evaluated individually, and the inspection device with the highest suitability for that particular item is selected, ensuring that each inspection is performed by the most appropriate device without unnecessary redundancy.
Solution Approach 2:
The system uses feedback mechanisms by calculating and comparing suitability values for multiple inspection devices for each inspection item. The suitability calculation unit continuously evaluates device performance and component states, providing feedback that informs the optimal allocation decision, thereby eliminating redundant inspections while maintaining comprehensive coverage.
3Device complexity
If inspection allocation is fixed based on design information, then program creation is simplified, but adaptability to actual inspection conditions deteriorates
Solution Approach 1:
The system implements dynamics by making inspection allocation flexible and adaptive rather than fixed. The suitability calculation unit dynamically recalculates the optimal inspection device assignment based on current component states and device conditions, allowing the inspection program to adapt to changing circumstances while maintaining a systematic approach to program creation.
Data Source
AI summary
An inspection system includes (1+n) types of imaging units each configured to capture an image of a substrate that is an inspection target and acquire image data, (1+m) types of inspection units each configured to perform, on the basis of (1+n) types of the image data respectively acquired by the (1+n) types of imaging units, an inspection suitability calculation unit configured to calculate, for each of inspection items related to each of components mounted on the substrate, inspection suitabilities each indicating a suitability of each of (1+m) types of the inspections performed by the (1+m) types of inspection units for detecting an abnormality according to the inspection item, and an inspection program creation unit configured to determine, on the basis of the inspection suitabilities, whether to perform each of the (1+m) types of inspections for each of the inspection items related to each of the components mounted on the substrate.