Active Matrix Substrate Repair via Laser Nano Metal
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The manufacturing of liquid crystal display apparatus is hindered by defects in the active matrix substrate, such as broken gate and source lines, which lead to line defects on the display screen, reducing the manufacturing yield.
Innovation Solution
An active matrix substrate with a repair method that includes inspecting for broken lines and forming repair sections using laser radiation and nano metal solutions to reconnect and harden the broken lines, ensuring continuous signal transmission.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If gate lines and source lines are made longer to cover the display panel, then the display area is increased, but the likelihood of broken lines increases
Solution Approach 1:
The gate lines and source lines are divided into multiple segments with isolation sections between them. This segmentation prevents a single broken line from causing continuous defects across the entire display panel, as the isolation sections electrically isolate defective segments from functional ones.
Solution Approach 2:
Isolation sections are pre-configured between gate lines and source lines during manufacturing. These isolation sections are prepared in advance to enable future repair operations without requiring redesign or reconfiguration when line breaks occur.
2Ease of manufacture
If traditional manufacturing processes are used without repair capabilities, then the manufacturing process is simpler, but the manufacturing yield decreases due to line defects
Solution Approach 1:
The display panel incorporates self-repair capabilities through isolated line configurations that allow defective lines to be identified and repaired without disrupting the entire manufacturing process. The isolation sections enable targeted repair operations on specific defective segments while maintaining functionality of other areas.
Solution Approach 2:
When line breaks occur, the affected line segments can be electrically isolated and effectively 'discarded' from the functional circuit, while the remaining isolated segments continue to operate. This allows recovery of partial functionality and enables repair operations without scrapping the entire display panel.
3Reliability
If isolation sections are added between lines to prevent defect propagation, then line defect impact is reduced, but the device complexity increases
Solution Approach 1:
Isolation sections are extracted and placed between gate lines and source lines to remove the harmful effect of defect propagation. These isolation sections electrically disconnect adjacent line segments, preventing defects from spreading across the entire display panel while maintaining the overall line structure.
4Productivity
If broken lines are not repaired, then the manufacturing process is faster, but the number of line defects increases reducing yield
Solution Approach 1:
The isolation sections are pre-configured during manufacturing to enable rapid identification and isolation of defective line segments. This preliminary preparation allows for quick repair operations without requiring extensive inspection or reconfiguration, thus maintaining manufacturing speed while improving the ability to address defects.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The repair method effectively improves the manufacturing yield of liquid crystal display apparatus by maintaining signal integrity and reducing line defects, with the nano metal solution enhancing conductivity and durability of the repair sections.
Implementation Method 1
performing a connection process to electrically connect portions of the source line repair sections, overlapping with the broken first gate line, to the broken first gate line respectively, and electrically connect portions of the source line repair sections, overlapping with the second gate line, to the gate line repair section
Implementation Method 2
the connection portions of the repair sections are coated with nano metal solution, and the nano metal solution is radiated by laser to be hardened, thereby conducting the repair sections
Data Source
AI summary
The present disclosure illustrates a method for correcting an active matrix substrate. The method includes steps: performing the broken-line inspection process to inspect whether the broken line exists on the first and second gate lines; if one first gate line is inspected to be broken, performing a source line repair-section forming process to cut off the cut portions of the second source lines disposed at two sides of a pixel electrode corresponding to a broken location of the first gate line, to form source line repair sections overlapping with the broken first gate line and the second gate line; performing a gate line repair-section forming process on the second gate line, adjacent to the broken first gate line, to cut off the cut portions of the second gate line to form a gate line repair section overlapping with the second source lines; and performing a connection process.