Substrate Mark Measurement for Printing Alignment Correction

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Solution Overview

Problem

Existing printing systems fail to accurately correct image data due to insufficient expansion/contraction information for substrates, leading to misalignment of printed images on substrates that expand and contract during transport and drying.

Innovation Solution

A printing system that includes measurement devices to detect marks on the substrate, measuring its state at multiple points along the transport path, and calculates correction values for image data based on these measurements to adjust for substrate deformation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If image data is corrected based on expansion/contraction information, then manufacturing precision is improved, but measurement precision is insufficient

Engineering Contradiction:
Improveimage alignment precisionVSAvoidexpansion/contraction measurement precision
Core Design Contradiction:
Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The measurement of substrate expansion/contraction is divided into multiple discrete measurement points along the transport path. Each measurement device detects marks at specific locations, and the processor integrates these segmented measurements to calculate comprehensive correction values, improving overall measurement precision without requiring a single impossibly precise measurement system

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Marks are introduced as intermediary elements on the substrate to enable indirect measurement of substrate deformation. Instead of directly measuring substrate dimensions, the system measures the displacement of these marks through the transport path, which serves as a mediator to capture expansion/contraction information with sufficient precision

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If multiple measurement devices are added to improve measurement precision, then device complexity increases

Engineering Contradiction:
Improvesubstrate state measurement precisionVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Multiple measurement devices are designed with substantially the same structure and function, each detecting marks on the substrate at different positions. This standardized multi-functional approach allows the system to achieve high measurement precision through redundancy while keeping individual device complexity low and simplifying maintenance and calibration

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system transitions from a single-point measurement approach to a multi-point spatial distribution of measurement devices along the transport path. By adding the dimension of spatial distribution, the system gains comprehensive measurement capability without requiring each individual device to be overly complex, as each device performs a simple mark-detection function

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Accurately corrects image data to ensure printed images align correctly, improving precision and efficiency by converting deformation amounts into numerical values for precise image size adjustments.

Implementation Method 1

a first ejection device that ejects a first liquid onto the substrate based on first image data

Methodology Applied
Scientific EffectEjection:

Implementation Method 2

a first drying device that dries the liquid ejected onto the substrate

Methodology Applied
Scientific EffectDrying:

Implementation Method 3

the first measurement device and the second measurement device each detect a mark printed on the substrate with the first liquid to measure the state of the substrate

Methodology Applied
Scientific EffectOptical detection:

Data Source

PatentUS20260034799A1Printing system
Publication Date: 2026.02.05 FUJIFILM CORP
  • US20260034799A1 patent drawing
  • US20260034799A1 patent drawing
  • US20260034799A1 patent drawing

AI summary

Provided is a printing system that calculates a correction value for correcting image data based on a state of a substrate. In a printing system that prints an image by ejecting a liquid onto a substrate, a transport device transports the substrate in an order of a first ejection device that ejects a first liquid onto the substrate based on first image data, a first measurement device, a first drying device, a second measurement device, and a second ejection device, the first measurement device and the second measurement device each detect a mark printed on the substrate with the first liquid to measure a state of the substrate, and the first ejection device corrects the first image data based on a measurement result of the first measurement device and a measurement result of the second measurement device.