Substrate Mark Pattern Control to Avoid Redundant Detection
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Solution Overview
Problem
In electronic device production systems, the unnecessary detection of bad marks on substrates by multiple mounting devices leads to decreased productivity due to the lack of individual identification numbers, resulting in inefficient mark detection processes.
Innovation Solution
A production system and method that includes a substrate counter, mark pattern acquisition unit, determination unit, and detection controller to identify and control the detection of mark patterns across substrates, allowing for optimized detection processes based on uniformity of mark patterns, thereby reducing unnecessary detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If each mounting device individually detects the bad mark on substrates, then the reliability of mark detection is improved, but the productivity deteriorates due to unnecessary detection
Solution Approach 1:
The patent merges the mark detection function across multiple mounting devices by introducing a shared detection result storage area. Instead of each device independently detecting marks, the system combines detection results from the first mounting device and stores them in a shared storage area, allowing subsequent mounting devices to retrieve results without redundant detection operations.
Solution Approach 2:
The patent applies preliminary action by having the first mounting device perform detection and store results before other mounting devices need the information. The detection result is prepared in advance and stored in the storage area, enabling other mounting devices to access the information without performing unnecessary detection operations themselves.
2Ease of operation
If individual identification numbers are provided to substrates, then the ease of operation is improved, but the device complexity increases
Solution Approach 1:
The patent introduces a mark pattern as an intermediary element that carries identification information about the substrate's printed state. Instead of directly providing complex individual identification numbers to substrates, the system uses mark patterns as a simplified intermediary carrier that encodes the necessary identification information, reducing the complexity of the identification system while maintaining ease of operation.
Data Source
AI summary
A production system includes: a substrate counter configured to count the number of substrates existing in a production line including a mounting device; a mark pattern acquisition unit configured to acquire a mark pattern indicating a pattern of a mark that is provided to each of the plurality of substrates counted by the substrate counter; a determination unit configured to determine whether the respective mark patterns of the plurality of substrates acquired by the mark pattern acquisition unit are the same as each other; and a detection controller configured to control a detection process of the mark pattern by the mounting device based upon a determination result of the determination unit.