Substrate Object Examination via Detector Position Synchronization
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for examining object properties in substrates, such as power lines, water lines, and reinforcing bars, face challenges in accurately determining object positions and properties due to limitations in detection field sizes and synchronization of position and measurement data, leading to inaccuracies and inefficiencies.
Innovation Solution
A method utilizing a detector device, localization device, and control device that adapts detection parameters to object properties, synchronizes position and measurement data, and adjusts the detector's position to ensure accurate measurements by comparing target coordinates against the detection field, allowing for precise examination of objects within, partially outside, or larger than the detection field.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the detector device is moved over the boundary surface to perform measurements, then object properties can be examined, but the synchronization of position data and measurement data becomes complex and error-prone
Solution Approach 1:
The patent introduces an intermediary coordinate system that serves as a common reference frame for both the detector device and the localization device. By transforming all position and measurement data into this unified coordinate system, the patent eliminates synchronization errors without requiring complex real-time coordination between devices. The intermediary coordinate system acts as a mediator that simplifies the data integration process.
2Ease of operation
If the detection field size is limited, then the detector device can be compact and easy to operate, but it cannot detect objects larger than the detection field or objects positioned outside the current detection field
Solution Approach 1:
The patent extends the detection capability from a single static detection field to a three-dimensional detection space by introducing height information and multiple detection planes. The detector device can detect objects at different heights and positions by moving in three dimensions, effectively expanding the detection coverage without increasing the physical size of the detection field itself. This allows compact detectors to examine large or distributed objects through sequential multi-position measurements.
Solution Approach 2:
The patent divides the examination of large objects into multiple segments by detecting different portions of an object at different positions and times. The localization device tracks the detector's position, and the control device assembles measurements from multiple segments into a complete object characterization. This segmentation approach allows a compact detector with limited field of view to examine objects much larger than its detection field.
3Adaptability or versatility
If multiple objects with varying properties and sizes are examined, then comprehensive substrate analysis is achieved, but the detection parameters must be continuously adjusted increasing measurement time
Solution Approach 1:
The patent performs preliminary actions by using the localization device to determine object positions and characteristics before detailed examination. The control device uses this preliminary information to pre-calculate optimal detection parameters and predict object locations, allowing the detector to be positioned efficiently and measurements to be taken with minimal parameter adjustments. This preliminary positioning and parameter setup reduces the overall measurement time for multiple objects.
Solution Approach 2:
The patent implements feedback by continuously monitoring detector position through the localization device and using this information to dynamically adjust detection parameters and guide the next measurement position. The control device processes measurement results and feeds this information back to optimize subsequent detection settings, creating an adaptive measurement sequence that minimizes total examination time while maintaining accuracy for objects of varying properties and sizes.
Data Source
AI summary
A method for examining object properties of an object in a substrate, using an arrangement that comprises a detector device, a localization device, and a control device is provided. The method includes selecting a first object having first object properties to be examined and first target coordinates and also includes determining an actual position of the detector device using the localization device. Moreover, the method includes determining by the control device an actual detection field from the actual position of the detector device, and comparing by the control device the first target coordinates with the actual detection field of the detector device.