Electronic Substrate Pad Layout for Thermal Shock Reliability

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Solution Overview

Problem

The coefficient of thermal expansion mismatch between a light-emitting diode (LED) and its base, such as glass, leads to cracks in the base or peeling of the LED during thermal shock tests, resulting in dark spots.

Innovation Solution

The electronic substrate design includes a protruding portion and a bonding pad where the bonding pad is not overlapped with the boundary of the protruding portion, creating a gap to reduce stress and improve solder joint flatness, thereby reducing the likelihood of base cracking and LED peeling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the bonding pad is positioned to overlap with the protruding portion boundary, then the solder joint flatness is improved, but the base cracking rate increases due to thermal expansion mismatch stress

Engineering Contradiction:
Improvesolder joint flatnessVSAvoidbase cracking rate
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The bonding pad is strategically positioned within the flat region of the protruding portion, avoiding the boundary area where stress concentrates. This local positioning optimization ensures that the bonding pad benefits from the flat surface for good solder joint formation while avoiding the high-stress boundary region that would cause base cracking during thermal cycling.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The invention changes the positional parameter of the bonding pad relative to the protruding portion boundary. By adjusting the bonding pad location to be entirely within the flat region and not overlapping with the boundary, the design optimizes both solder joint quality and structural reliability under thermal stress.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the bonding pad is positioned away from the protruding portion boundary, then the base cracking rate is reduced, but the solder joint flatness may be compromised

Engineering Contradiction:
Improvebase cracking rateVSAvoidsolder joint flatness
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The bonding pad is positioned within the flat region of the protruding portion, utilizing the locally flat surface to ensure good solder joint formation. This local positioning within the flat region simultaneously achieves both solder joint quality and reduced stress concentration.

Inventive Principle:
Principle #3Local quality

3Strength

If the protruding portion boundary overlaps with the bonding pad, then the structural support is enhanced, but the thermal shock resistance deteriorates due to stress concentration

Engineering Contradiction:
Improvestructural supportVSAvoidthermal shock resistance
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

The bonding pad is positioned within the flat region away from the boundary, utilizing the locally flat and supported area for optimal bonding while avoiding the boundary region where stress concentrates during thermal expansion and contraction.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The flat region of the protruding portion acts as an intermediary zone between the bonding pad and the boundary. By positioning the bonding pad within this intermediate flat region, the design provides both structural support and stress relief, preventing direct stress transmission to the bonding pad during thermal cycling.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design reduces the base cracking rate from 11.5% to 2% and maximum stress from 2905 MPa to 752 MPa, enhancing the reliability of the electronic device.

Implementation Method 1

coefficient of thermal expansion (CTE) mismatch readily occurs between the LED and the base (such as glass), thus leading to cracks in the base or peeling of the LED

Methodology Applied
Scientific EffectThermal expansion: Thermal Expansion

Implementation Method 2

when a base welded with a light-emitting diode (LED) is subjected to a thermal shock test

Methodology Applied
Scientific EffectThermal shock: Thermal Shock

Data Source

PatentUS12362300B2Electronic substrate and electronic device
Publication Date: 2025.07.15 INNOLUX CORP
  • US12362300B2 patent drawing
  • US12362300B2 patent drawing
  • US12362300B2 patent drawing

AI summary

An electronic substrate and an electronic device are provided. The electronic substrate includes a base, a conductive electrode, and a first layer. The conductive electrode and the first layer are disposed on the base, the first layer surrounds the conductive electrode and overlaps an edge portion of the conductive electrode. In a cross-sectional view, the first layer is divided into a first part and a second part, the conductive electrode is located between the first part and the second part, and a width of the first part is different from a width of the second part.