Substrate Plasma Processing with Ballast Gas Pressure Control

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Solution Overview

Problem

Existing substrate processing methods, such as ALD and ALE using plasma, take too long to reach the desired pressure for forming plasma, affecting throughput and film quality.

Innovation Solution

Introduce a ballast gas into the exhaust pipe to quickly regulate the pressure in the processing container during the substrate processing, allowing for rapid formation of plasma by alternating gas supply and discharge cycles.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If conventional substrate processing methods are used without ballast gas introduction, then the system structure remains simple, but the time to reach desired pressure is too long

Engineering Contradiction:
Improvetime to reach desired pressureVSAvoidsystem structure complexity
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

A ballast gas introduction mechanism is introduced as an intermediary component in the exhaust pipe. This mechanism includes a ballast gas supply source and a flow rate control valve that regulate the ballast gas flow. The ballast gas acts as a mediator to rapidly adjust the pressure in the processing container by being mixed with the exhaust gas flow, thereby solving the contradiction between simplicity and speed without requiring complex vacuum pump changes

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If ballast gas is introduced into the exhaust pipe, then the pressure regulation speed is significantly improved, but the device complexity increases

Engineering Contradiction:
ImprovethroughputVSAvoiddevice complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The ballast gas introduction mechanism is designed to serve multiple functions: it rapidly regulates pressure during plasma formation, maintains stable pressure during film formation, and can be integrated with existing exhaust pipe structures. The flow rate control valve enables the system to adapt to different processing requirements by adjusting ballast gas flow rates, making the system universally applicable to various substrate processing scenarios without requiring separate systems for each function

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Speed

If ballast gas flow rate is increased to quickly reach desired pressure, then the pressure regulation speed improves, but the energy consumption increases

Engineering Contradiction:
Improvepressure regulation speedVSAvoidenergy consumption
Core Design Contradiction:
SpeedVSUse of energy by moving object

Solution Approach 1:

The ballast gas flow rate is dynamically adjusted based on the processing stage and pressure requirements. During plasma formation, when rapid pressure adjustment is needed, the flow rate control valve increases ballast gas flow to achieve quick pressure stabilization. During film formation, the flow rate is reduced to maintain stable pressure conditions. This dynamic adjustment optimizes the balance between pressure regulation speed and energy consumption, avoiding continuous high energy input

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly reduces the time required to achieve the desired pressure, improving throughput and enabling precise control over film formation, whether isotropic or anisotropic, thus enhancing film quality and efficiency.

Implementation Method 1

introducing a ballast gas into the exhaust pipe

Methodology Applied
Scientific EffectGas flow regulation:

Implementation Method 2

forming plasma of the processing gas supplied into the processing container

Methodology Applied
Scientific EffectPlasma formation: Plasma

Data Source

PatentUS12362156B2Substrate processing method and substrate processing apparatus
Publication Date: 2025.07.15 TOKYO ELECTRON LTD
  • US12362156B2 patent drawing
  • US12362156B2 patent drawing
  • US12362156B2 patent drawing

AI summary

A substrate processing method for performing a predetermined process on a substrate includes performing, a plurality of times, a cycle including (a) supplying a first processing gas into a processing container to which an exhaust pipe is connected and which accommodates the substrate and (b) supplying a second processing gas into the processing container, wherein at least one of (a) and (b) includes (c) introducing a ballast gas into the exhaust pipe and forming plasma of the processing gas supplied into the processing container.