Silicon Substrate Liquid Supply Port Dry Etching Tilt Control

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Solution Overview

Problem

The existing method of forming independent liquid supply ports in substrates for liquid ejection heads through dry etching often results in tilt, leading to deviations in the opening position and increased chip size, which lowers reliability and productivity.

Innovation Solution

A process involving sequential steps of forming an etching protection film, removing the bottom portion of the film, and etching the silicon substrate, where the sheath formed during film removal is thicker than during etching, using the Bosch process to ensure vertical ion incidence and prevent tilt.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If dry etching is used to form independent liquid supply ports in the bottom of common liquid supply ports, then chip size can be made smaller, but tilt occurs causing opening position deviation and reduced reliability

Engineering Contradiction:
Improvechip sizeVSAvoidopening position accuracy
Core Design Contradiction:
Volume of moving objectVSReliability

Solution Approach 1:

The invention forms a protective film on the inner surface of the common liquid supply port before forming the independent liquid supply port. This preliminary protective action prevents tilt during the subsequent etching process, ensuring accurate opening positions while maintaining small chip size.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The protective film acts as an intermediary element between the etching process and the common liquid supply port. It mediates the etching process to prevent tilt and ensure vertical formation of independent liquid supply ports, thereby maintaining opening position accuracy.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If dry etching is used to form vertical liquid supply ports, then manufacturing precision is improved, but productivity decreases due to complex sequential processes

Engineering Contradiction:
Improveliquid supply port verticalityVSAvoidproduction efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The invention combines the protective film formation and etching processes into a single integrated dry etching sequence. The protective film is formed and etching is performed in one continuous process, maintaining verticality while improving productivity compared to separate sequential processes.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The invention uses periodic alternating etching and protective film formation steps within the dry etching process. This periodic action maintains verticality through controlled protection and etching cycles, achieving both precision and efficiency.

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach inhibits tilt occurrence, maintaining productivity while ensuring the liquid supply ports are perpendicular to the substrate, thus enhancing reliability and preventing chip size increases.

Implementation Method 1

a step of forming a liquid supply port passing through a silicon substrate by dry etching

Methodology Applied
Scientific EffectDry etching:

Implementation Method 2

wherein a sheath formed in the step (2) is thicker than a sheath formed in the step (3)

Methodology Applied
Scientific EffectSheath formation:

Data Source

PatentUS9102153B2Processes for producing substrate for liquid ejection head
Publication Date: 2015.08.11 CANON KK
  • US9102153B2 patent drawing
  • US9102153B2 patent drawing
  • US9102153B2 patent drawing

AI summary

A process for producing a substrate for a liquid ejection head, including a step of forming a liquid supply port passing through a silicon substrate by dry etching, the step being a step of sequentially repeating the steps of (1) forming an etching protection film on the silicon substrate, (2) removing a bottom portion of the etching protection film, and (3) etching the silicon substrate, wherein a sheath formed in the step (2) is thicker than a sheath formed in the step (3).