Substrate Production Simulation for Component Supply Delays
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Solution Overview
Problem
Existing substrate production simulation methods fail to accurately estimate production delays caused by operator operations, as they either ignore operator delays or do not simulate delays in the production process effectively.
Innovation Solution
A substrate production simulation method that simulates production with and without delays in component supply, allowing for the display of production delays and their contributing factors on the same screen, enabling easy estimation of delay factors by comparing results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If production simulation is performed without considering operator delays, then calculation complexity is reduced, but accuracy of production delay estimation deteriorates
Solution Approach 1:
The simulation is divided into multiple scenarios: a first result assuming no delays in component supply device provision/collection, and a second result assuming delays occur. This segmentation allows complex operator delay factors to be isolated and analyzed separately, reducing overall calculation complexity while maintaining estimation accuracy through comparative analysis.
Solution Approach 2:
The patent introduces a hypothetical excessive delay scenario in the second simulation result to explicitly model operator intervention impacts. By simulating extreme cases rather than trying to model all possible delay variations, the system achieves accurate delay factor identification without requiring exhaustive simulation of every possible operator action.
2Measurement precision
If multiple simulation results are compared to identify delay factors, then production delay estimation accuracy is improved, but information processing complexity increases
Solution Approach 1:
The system uses feedback by comparing the first simulation result (no delay assumption) with the second simulation result (delay assumption). The difference between these results provides feedback information that directly identifies the impact of operator delays on production, enabling accurate delay factor estimation through systematic comparison rather than complex individual factor analysis.
Solution Approach 2:
The first simulation result is obtained in advance under ideal conditions (no delays), serving as a baseline for subsequent comparison. This preliminary action establishes a reference point that simplifies the analysis of the second result, reducing the information processing required to identify delay factors by eliminating the need to model all possible scenarios from scratch.
3Loss of information
If detailed parameter tracking is implemented to identify delay factors, then production delay analysis capability is improved, but ease of operation deteriorates
Solution Approach 1:
The patent merges the comparison of multiple simulation results with the identification of delay factors into a single integrated process. By combining the first and second simulation results and automatically calculating their differences, the system retains detailed parameter information while simplifying the user operation to merely initiating the comparison, rather than requiring manual analysis of individual parameters.
Data Source
AI summary
Production of a product substrate on which mounting of a component supplied from a component supply device is completed is simulated using a substrate production line including a mounting line in which multiple component mounters for mounting the component on a substrate are arranged. The method includes (a), obtaining a first result by simulation on the assumption that provision and/or collection of the component supply device with respect to the substrate production line are performed without delay. (b) Obtaining a second result by simulation on the assumption that the provision and/or collection of the component supply device with respect to the substrate production line is performed by an automated facility and/or a worker. (c) A production delay of the second result with respect to the first result and a parameter to be a factor of the production delay included in the second result are output on the same screen.