Substrate Reuse and Defect Screening in Electronic Device Manufacturing

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Solution Overview

Problem

The manufacturing cost of existing electronic devices, such as those including light-emitting diodes, is high, necessitating a method to reduce these costs.

Innovation Solution

A manufacturing method for electronic devices that involves forming a sacrificial layer on a substrate, creating a semiconductor structure, separating it from the substrate, detecting defects, and classifying the substrate, which can include using recycled substrates to further reduce costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional manufacturing methods are used for electronic devices, then the manufacturing process is established and reliable, but the manufacturing cost is high

Engineering Contradiction:
Improvemanufacturing process reliabilityVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent implements substrate recycling by separating the semiconductor structure from the substrate, inspecting the substrate for defects, and reusing qualified substrates. This recovers valuable substrate materials that would otherwise be discarded, directly reducing manufacturing costs while maintaining process reliability through systematic inspection and classification protocols

Inventive Principle:
Principle #34Discarding and recovering

2Ease of manufacture

If substrates are reused to reduce costs, then manufacturing cost decreases, but defect detection and classification processes become more complex

Engineering Contradiction:
Improvemanufacturing costVSAvoidsubstrate inspection and classification system
Core Design Contradiction:
Ease of manufactureVSDevice complexity

Solution Approach 1:

The inspection process is segmented into distinct stages: defect detection, defect classification, and substrate classification. This segmentation allows each stage to be optimized independently and managed systematically, reducing the perceived complexity while enabling comprehensive quality control for recycled substrates

Inventive Principle:
Principle #1Segmentation

3Manufacturing precision

If substrates are inspected and classified, then substrate quality is improved, but the manufacturing process time increases

Engineering Contradiction:
Improvesubstrate qualityVSAvoidmanufacturing process time
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

Substrate inspection and classification are performed in advance before the semiconductor manufacturing process begins. This preliminary action ensures that only qualified substrates enter production, preventing defects from propagating through the manufacturing process and reducing rework time, thereby improving overall manufacturing precision without proportionally increasing total process time

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20250133868A1Manufacturing method of electronic device
Publication Date: 2025.04.24 INNOLUX CORP
  • US20250133868A1 patent drawing
  • US20250133868A1 patent drawing
  • US20250133868A1 patent drawing

AI summary

A method of manufacturing an electronic device includes: forming a sacrificial layer on a substrate; forming a semiconductor structure on the sacrificial layer; separating the semiconductor structure from the substrate; detecting defects on the substrate; and classifying the substrate.