Substrate Rotation and Gas Supply Synchronization Control

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Solution Overview

Problem

In substrate processing for semiconductor devices, synchronization between gas supply period and rotation period can lead to inconsistent film thickness, contradicting the goal of eliminating distance-related influences through rotation.

Innovation Solution

A substrate processing apparatus with a controller that adjusts the rotation period and gas supply period to ensure they never match, specifically satisfying the equation |mP−nT| > 0, preventing synchronization during alternate gas supply operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If gas is supplied periodically to form film layer by layer, then the film formation precision is improved, but the complexity of coordinating gas supply period and rotation period increases

Engineering Contradiction:
Improvefilm formation precisionVSAvoidcoordination control complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent employs feedback control through a controller that monitors and adjusts the relationship between gas supply period T and rotation period P. The controller ensures that these periods do not synchronize by detecting potential synchronization conditions and adjusting one of the periods accordingly, thereby maintaining film formation precision while managing the coordination complexity through automated feedback mechanisms.

Inventive Principle:
Principle #23Feedback

2Ease of operation

If the gas supply period T and rotation period P are made equal for simplicity, then the control complexity is reduced, but the film thickness consistency deteriorates due to synchronization

Engineering Contradiction:
Improvecontrol simplicityVSAvoidfilm thickness consistency
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The patent deliberately changes the parameters T and P to be different values, preventing synchronization between gas supply and substrate rotation. This parameter differentiation, while slightly increasing control complexity, is necessary to maintain film thickness consistency by ensuring that gas is supplied to different locations on the substrate during each rotation cycle.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This adjustment enhances film thickness consistency across the substrate surface, improving uniformity by ensuring gas is dispersed evenly without being supplied to the same point repeatedly, thereby improving the overall film formation process.

Implementation Method 1

a substrate rotating mechanism for rotating the substrate

Methodology Applied
Scientific EffectRotation:

Implementation Method 2

the gases are allowed to be adsorbed one atomic layer by one atomic layer

Methodology Applied
Scientific EffectAdsorption: Adsorption

Implementation Method 3

a film is formed utilizing surface reaction

Methodology Applied
Scientific EffectSurface reaction:

Implementation Method 4

a controller for controlling a rotation period of the substrate or a gas supply period defined as a time period between an instant when the gas A is made to flow and an instant when the gas A is made to flow next time such that the rotation period and the gas supply period are not brought into synchronization with each other

Methodology Applied
Scientific EffectSynchronization prevention:

Data Source

PatentUS8901011B2Substrate processing apparatus and semiconductor device producing method
Publication Date: 2014.12.02 KOKUSAI DENKI KK
  • US8901011B2 patent drawing
  • US8901011B2 patent drawing
  • US8901011B2 patent drawing

AI summary

Disclosed is a substrate processing apparatus, including: a processing chamber for processing a substrate; a substrate rotating mechanism for rotating the substrate; a gas supply unit for supplying gas to the substrate, at least two kinds of gases A and B being alternately supplied a plurality of times to form a desired film on the substrate; and a controller for controlling a rotation period of the substrate or a gas supply period defined as a time period between an instant when the gas A is made to flow and an instant when the gas A is made to flow next time such that the rotation period and the gas supply period are not brought into synchronization with each other at least while the alternate gas supply is carried out predetermined times.