Substrate Inspection Merging Image Data for Stain Detection
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Solution Overview
Problem
Existing substrate inspection methods struggle with accuracy and reliability due to the formation of stains at the same position on multiple substrates, which are often undetected by automated facilities and require human judgment to assess acceptability.
Innovation Solution
A substrate inspecting apparatus and method that divides and merges image data to normalize brightness levels, allowing for improved detection of stains by calculating normal values and enhancing the detection of stains at fixed positions through merged image data analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If automated facility inspection is used, then productivity is improved, but measurement precision deteriorates due to undetected stains
Solution Approach 1:
The patent merges multiple basic image data sets captured from different substrates to create composite image data. By combining images where stains appear at the same positions, the inspection system enhances stain visibility and detection accuracy while maintaining automated high-speed inspection capabilities.
Solution Approach 2:
The system performs preliminary normalization processing on basic image data before merging, calculating normal values for stain and non-stain areas in advance. This preprocessing ensures that when images are combined, brightness variations are corrected and stains become more prominent, improving detection precision without adding inspection time.
2Measurement precision
If human judgment is involved in inspection, then measurement precision is improved, but productivity deteriorates
Solution Approach 1:
The patent replaces the mechanical human inspection process with an automated image processing system that performs normalization and merging operations. The merger unit automatically identifies stains by comparing merged image data against normal values, eliminating the need for manual inspection while maintaining or improving detection accuracy through systematic image analysis.
3Device complexity
If basic image data is used directly, then device complexity is reduced, but measurement precision deteriorates due to brightness variations
Solution Approach 1:
The system changes the brightness parameter of image data by normalizing each basic image data set against calculated normal values. This parameter transformation enhances the contrast between stain and non-stain areas, making stains more detectable in the merged image data while using only standard image processing operations.
Data Source
AI summary
A substrate inspecting apparatus includes an image sensor that captures an image of a substrate to generate basic image data, and a merger that divides the basic image data into first image data including a first stain area and a first non-stain area and second image data including a second stain area and a second non-stain area, and that merges the first image data and the second image data to generate merged image data including a merged stain area representing the first stain area and the second stain area and a merged non-stain area representing the first non-stain area and the second non-stain area.


