Substrate Support Projection Layout to Prevent Wafer Sliding

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Solution Overview

Problem

Existing film forming apparatuses face challenges in suppressing substrate sliding over the substrate support, leading to increased particle occurrence due to inadequate frictional forces during rotation and thermal expansion.

Innovation Solution

The apparatus incorporates a recess in the substrate support with a projection along its outer periphery, forming a film with a high coefficient of friction to prevent substrate sliding and particle occurrence, by enhancing gas flow and frictional contact between the substrate and the support.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional substrate support without projections is used, then the device complexity is low, but substrate sliding occurs due to insufficient frictional force

Engineering Contradiction:
Improvesubstrate sliding suppressionVSAvoidsubstrate support structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The substrate support surface is modified with projections at specific locations (along the outer periphery of the substrate) rather than uniformly across the entire surface. This localized modification increases friction only where needed to prevent sliding, while maintaining simplicity in other areas of the substrate support.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

A film with high frictional properties is formed on the projections before substrate processing begins. This preliminary film formation creates the necessary frictional force to prevent substrate sliding during subsequent processing operations, addressing the sliding issue before it occurs.

Inventive Principle:
Principle #10Preliminary action

2Productivity

If substrate rotation speed is increased to improve processing efficiency, then productivity increases, but substrate sliding worsens due to reduced frictional contact time

Engineering Contradiction:
Improveprocessing efficiencyVSAvoidsubstrate sliding suppression
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The frictional properties of the substrate support surface are changed by forming a film with specifically engineered friction characteristics on the projections. This parameter change in surface friction allows the substrate to remain stable even at higher rotation speeds, decoupling productivity improvement from sliding deterioration.

Inventive Principle:
Principle #35Parameter changes

3Object-generated harmful factors

If the substrate support surface is made smoother to reduce particle generation, then manufacturing precision improves, but frictional force decreases leading to increased substrate sliding

Engineering Contradiction:
Improveparticle occurrenceVSAvoidsubstrate sliding suppression
Core Design Contradiction:
Object-generated harmful factorsVSReliability

Solution Approach 1:

The substrate support surface is designed with dual characteristics: smooth areas (without projections) to minimize particle generation, and localized projection areas to provide friction for sliding suppression. This spatial differentiation of surface quality allows simultaneous achievement of low particle occurrence and effective sliding prevention.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration effectively reduces substrate sliding and particle occurrence, maintaining low substrate sliding percentages and particle adherence even at higher cumulative film thicknesses, thereby improving processing stability and efficiency.

Implementation Method 1

The apparatus incorporates a recess in the substrate support with a projection along its outer periphery, forming a film with a high coefficient of friction to prevent substrate sliding

Methodology Applied
Scientific EffectPhysical Vapour Deposition: Physical Vapour Deposition

Implementation Method 2

enhancing gas flow and frictional contact between the substrate and the support

Methodology Applied
Scientific EffectFriction: Friction

Data Source

PatentUS20240209507A1Film forming apparatus
Publication Date: 2024.06.27 TOKYO ELECTRON LTD
  • US20240209507A1 patent drawing
  • US20240209507A1 patent drawing
  • US20240209507A1 patent drawing

AI summary

A film forming apparatus includes a processing chamber and a substrate support provided in the processing chamber. The substrate support includes a recess in which a substrate is placed. The recess includes a projection at a bottom surface thereof. The projection is provided along an outer periphery of the substrate placed in the recess.