Substrate Surface Cleaning With Excited Species and Vapor Etchants

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Solution Overview

Problem

The fabrication of integrated circuits is hindered by unwanted materials such as native oxide layers and contaminants on substrate surfaces, which increase defects and affect electrical performance, and existing removal methods are time-consuming and negatively impact throughput.

Innovation Solution

A method involving a substrate processing system that uses excited species and etchant species, such as radicals and ions, to remove organic and non-organic residues from the substrate surface, with optional cycles and purging steps to enhance efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional methods are used to remove unwanted material from substrate surface, then cleaning effectiveness is improved, but processing time increases and throughput decreases

Engineering Contradiction:
Improvecleaning effectivenessVSAvoidthroughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent changes the chemical parameters of the cleaning process by using vapor phase etchants and controlling temperature, pressure, and composition parameters to achieve effective material removal while maintaining fast processing speeds that preserve throughput

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces mechanical or wet chemical cleaning methods with a vapor phase chemical etching process, substituting physical contact-based removal with gas-phase chemical reactions that are faster and more controllable

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Ease of manufacture

If substrate is exposed to oxygen during fabrication process, then material layers can be formed, but native oxide layers form on substrate surface causing defects

Engineering Contradiction:
Improvematerial layer formationVSAvoidnative oxide layer formation
Core Design Contradiction:
Ease of manufactureVSObject-generated harmful factors

Solution Approach 1:

The patent applies preliminary cleaning action by removing native oxide layers and contaminants from the substrate surface before material layer deposition, ensuring a clean surface that prevents defect formation while allowing subsequent material formation to proceed

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent uses vapor phase etchants as intermediary substances that selectively react with and remove unwanted oxide layers and contaminants, acting as a mediator between the substrate and the deposition process to enable clean surface preparation

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively minimizes the negative impact on throughput by efficiently removing unwanted residues, improving the quality of material layers and reducing defects in integrated circuits.

Implementation Method 1

contacting the surface of the substrate with an excited species within the chamber

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

the excited species comprises a radical comprising hydrogen, argon, nitrogen, fluorine, chlorine, or oxygen

Methodology Applied
Scientific EffectRadical reaction:

Implementation Method 3

contacting the surface of the substrate with an etchant species within the chamber

Methodology Applied
Scientific EffectChemical etching:

Implementation Method 4

the etchant species may be a reducing species, an oxidizing species

Methodology Applied
Scientific EffectOxidation: Oxidation

Implementation Method 5

the etchant species may be a reducing species, an oxidizing species

Methodology Applied
Scientific EffectReduction: Reduction

Data Source

PatentUS20240371662A1Method, system and apparatus for surface modification
Publication Date: 2024.11.07 ASM IP HLDG BV
  • US20240371662A1 patent drawing
  • US20240371662A1 patent drawing
  • US20240371662A1 patent drawing

AI summary

Described herein are example, method, system and apparatus for supporting a substrate in a chamber wherein the substrate comprises a surface, contacting the surface of the substrate with an excited species within the chamber, contacting the surface of the substrate with an etchant species within the chamber and removing organic residue or non-organic residue, or a combination thereof, from the surface of the substrate responsive to executing the above steps.