Substrate Transfer Layout With Overlapping Multi-Height Bypass Paths

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Solution Overview

Problem

Existing substrate processing systems face inefficiencies in transferring wafers between processing modules and exposure apparatuses, particularly in bypassing non-processing modules, leading to increased complexity and potential interference with main transfer mechanisms.

Innovation Solution

A substrate processing apparatus with bypass transfer mechanisms that have different heights and partially overlap each other, allowing wafers to be transferred between processing blocks without passing through processing modules, utilizing shuttles and main transfer mechanisms to optimize the transfer path.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If bypass transfer mechanisms are added to transfer wafers between processing blocks, then wafer transfer efficiency is improved, but device complexity increases due to additional transfer paths and mechanisms

Engineering Contradiction:
Improvewafer transfer efficiencyVSAvoidtransfer mechanism complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent introduces bypass transfer paths that operate in a different spatial dimension (above or below the main transfer path) to transfer wafers between processing blocks. This dimensional separation allows bypass transfers to occur simultaneously with main transfers without interfering with each other, thus improving wafer transfer efficiency while managing system complexity through spatial organization.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If bypass transfer paths are arranged at the same height, then structural simplicity is maintained, but transfer paths interfere with each other reducing reliability

Engineering Contradiction:
Improvetransfer path arrangementVSAvoidtransfer operation reliability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent resolves path interference by arranging bypass transfer paths at different heights (vertical dimension) rather than at the same level. This vertical separation ensures that multiple bypass paths can operate simultaneously without colliding or interfering with each other, thereby improving transfer operation reliability while maintaining a relatively simple horizontal arrangement.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS12381102B2Substrate processing apparatus and substrate processing method
Publication Date: 2025.08.05 TOKYO ELECTRON LTD
  • US12381102B2 patent drawing
  • US12381102B2 patent drawing
  • US12381102B2 patent drawing

AI summary

A substrate processing apparatus includes: a loading/unloading block; a processing station provided on one of left and right sides of the loading/unloading block; a relay block provided on one of left and right sides of the processing station; processing blocks provided side by side in a left-right direction to form the processing station, each of the processing blocks including a processing module configured to perform a process on the substrate and a main transfer mechanism configured to deliver the substrate to the processing module; and bypass transfer mechanisms provided separately from the main transfer mechanism and provided respectively for the processing blocks arranged side by side in the left-right direction to transfer the substrate between left and right blocks, wherein bypass transfer paths for the substrate transferred by the plurality of bypass transfer mechanisms have heights different from each other, and partially overlap each other in a plan view.