Sub-Wavelength Imaging Using Destructive Interference Nodes
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional optical imaging techniques struggle to visualize features below the resolution limit, leading to artifacts and low signal strength from sub-wavelength structures, making it difficult to accurately image nanoscale systems.
Innovation Solution
A visualization system utilizing grouped emitters that generate destructive interference nodes between them, allowing for the capture of scattered light from sub-wavelength features by focusing on the anisotropic excitation of these emitters, which reduces reliance on numerical aperture and enables visualization through destructive interference patterns.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional optical imaging techniques are used, then the imaging system is simple and easy to operate, but the resolution is limited by the wavelength of light and cannot visualize sub-wavelength features
Solution Approach 1:
The patent introduces grouped emitters (such as fluorescent molecules or quantum dots) as intermediary elements between the sample and the detection system. These emitters are positioned near the sub-wavelength features and are excited by light to emit fluorescence, which is then collected by the objective lens. The emitters act as a mediator that enhances the signal from sub-wavelength features without requiring the objective lens to have high numerical aperture, thus improving resolution while keeping the device relatively simple.
Solution Approach 2:
The patent segments the imaging function into two parts: (1) the grouped emitters that are selectively excited and emit light near the sub-wavelength features, and (2) the objective lens that collects the emitted light. This segmentation allows the system to achieve super-resolution by focusing the enhancement function in the emitters rather than requiring the entire imaging system to be complex.
2Measurement precision
If confocal microscopy or immersion objectives are used to improve resolution, then sub-wavelength features can be visualized, but the device complexity increases and the field of view decreases
Solution Approach 1:
The patent applies local quality by positioning grouped emitters specifically in the regions of interest near sub-wavelength features. The emitters are selectively excited by focused light, and their fluorescence is collected to provide enhanced signal from those specific locations. This localized enhancement allows high-resolution imaging of sub-wavelength features without requiring the entire field of view to be optimized for high resolution, thus maintaining a larger overall field of view.
3Reliability
If conventional imaging is used, then the device is simple to operate, but the signal strength from sub-wavelength structures is low and artifacts are generated
Solution Approach 1:
The grouped emitters serve as intermediaries that significantly amplify the signal from sub-wavelength features. When excited by light, these emitters emit fluorescence that is much stronger than the direct scattering or transmission signal from the sub-wavelength structures themselves. This intermediary emission process provides strong, reliable signals for imaging sub-wavelength features without requiring complex operational procedures.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the visualization of sub-wavelength features without the need for confocal microscopy or immersion objectives, providing a larger field of view and improved signal-to-noise ratio, allowing for direct visualization of nanoscale structures.
Implementation Method 1
grouped emitters positioned to generate destructively interfering radiation within the spacing
Implementation Method 2
a first of the grouped emitters is driven by excitation radiation of a first phase; and a second of the grouped emitters is driven by excitation radiation of a second phase different from the first phase
Data Source
AI summary
Objects and/or grouped emitters are anti-symmetrically excited. The anti-symmetric radiation emitted by the objects generate an interference pattern with a node in the spacing between the objects. The spacing may be sub-wavelength and/or below a resolution limit for the emitted radiation. Samples within the spacing may be detected via distortion to the inference pattern and visualized (including sub-resolution limit features) either directly or through reconstruction analysis from the interference pattern.