Subword Driver Circuit Dynamic Potential Switching

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Solution Overview

Problem

In DRAM semiconductor devices, the negative potential applied to subword lines to reduce off-leak current and prevent information retention deterioration leads to increased GIDL current, making it challenging to balance disturbance characteristics and current specifications due to manufacturing processing deviations.

Innovation Solution

A semiconductor device with subword driver circuits that supply multiple non-selection and selection potentials, allowing the non-active potential of subword lines to be dynamically adjusted based on accessing states, thereby reducing GIDL current and improving disturbance characteristics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the negative potential applied to subword lines is lowered to reduce off-leak current and prevent information retention deterioration, then the disturbance characteristic is improved, but the GIDL current increases

Engineering Contradiction:
Improveinformation retention characteristicVSAvoidGIDL current
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The subword driver circuit dynamically switches between multiple negative potentials (first negative potential and second negative potential) based on the accessing state of memory cells. When memory cells are accessed, the first negative potential is applied; when not accessed, the second negative potential (lower than first) is applied. This dynamic adjustment resolves the contradiction by adapting the potential level to operational requirements, reducing GIDL current during non-access periods while maintaining disturbance protection during access periods.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The invention changes the parameter of subword line potential from a fixed negative value to a variable negative value with at least two distinct levels. The subword driver circuit selects between first and second negative potentials based on accessing state, thereby changing the electrical parameter adaptively. This parameter change enables optimization of both disturbance characteristic and GIDL current by matching potential level to operational context.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If a fixed negative potential is applied to subword lines, then the disturbance characteristic can be maintained, but the GIDL current increases and manufacturing tolerance becomes problematic

Engineering Contradiction:
Improvedisturbance characteristicVSAvoidmanufacturing processing deviation tolerance
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

Instead of relying on precise manufacturing of a single fixed potential value, the invention uses a dynamic system that switches between two negative potentials generated by separate circuits. This approach makes the system less sensitive to manufacturing variations because each potential can be independently optimized and adjusted, reducing the impact of processing deviations on overall performance.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The subword driver circuit is segmented into multiple potential generation paths (first negative potential circuit and second negative potential circuit), each capable of independent optimization. This segmentation allows manufacturing variations to be managed separately for each potential generation path, improving ease of manufacture while maintaining reliable disturbance protection through the switching mechanism.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS10332584B2Semiconductor device including subword driver circuit
Publication Date: 2019.06.25 MICRON TECHNOLOGY INC
  • US10332584B2 patent drawing
  • US10332584B2 patent drawing
  • US10332584B2 patent drawing

AI summary

The present invention is provided with; subword drivers SWD for driving subword lines SWL, a selection circuit for supplying either negative potential VKK1 or VKK2 to the subword drivers SWD, and memory cells MC that are selected in the case when the subword line SWL is set to an active potential VPP and are not selected in the case when the subword line SWL is either a negative potential VKK1 or VKK2.