Suction Cup Test Probe for Versatile Electronic Device Testing
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Solution Overview
Problem
Existing test apparatuses for electronic devices are often bulky, expensive, and require significant time and effort to modify for testing different types of devices, limiting their versatility and efficiency.
Innovation Solution
A device with suction cups and spring-loaded connector pins that can be quickly attached and aligned to electronic devices without the need for customized fixtures, allowing for rapid reconfiguration and electrical testing without magnification or complex jigs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If existing test apparatuses are used, then electrical testing can be performed, but the devices are bulky and expensive with limited versatility
Solution Approach 1:
The test apparatus is divided into separate modular components: a handheld probe assembly with suction cup and connector pins, and a separate testing system. This segmentation allows the probe to be a simple, lightweight tool while the complexity is concentrated in the testing system, enabling versatility without bulkiness in the handheld device.
Solution Approach 2:
The probe assembly is designed as a universal tool that can test multiple types of electronic devices through quick-change adapters and reconfigurable connector pin arrangements. The suction cup mechanism and spring-loaded pins provide a standardized interface that adapts to different device forms factors, eliminating the need for multiple specialized test apparatuses.
2Adaptability or versatility
If existing test apparatuses are modified to test different device types, then versatility improves, but significant time and effort are required
Solution Approach 1:
The connector pins are spring-loaded to provide automatic contact pressure adjustment, and the suction cup provides dynamic attachment that adapts to different surface geometries. These dynamic features eliminate the need for manual adjustment and reconfiguration when testing different devices, reducing modification time while maintaining versatility.
Solution Approach 2:
The spring-loaded connector pins automatically adjust their contact force and positioning when the probe is attached to different devices via the suction cup. The system self-adjusts to maintain proper electrical contact without requiring manual intervention or reconfiguration, enabling rapid switching between different device types.
3Measurement precision
If customized fixtures and probe cards are used, then testing precision improves, but device complexity and cost increase
Solution Approach 1:
The traditional mechanical fixture and probe card system is replaced with a suction cup-based attachment mechanism combined with spring-loaded connector pins. This substitution maintains testing precision through reliable electrical contact while eliminating the complexity and cost of customized mechanical fixtures and rigid probe cards.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and versatile electrical testing of various electronic devices by providing secure attachment and alignment, reducing the need for customized fixtures and probe cards, and allowing for quick relocation and reconfiguration.
Implementation Method 1
a vacuum pressure supplying unit configured to supply a vacuum pressure to the suction cups
Implementation Method 2
connector pins coupled to the frame; the connector pins being configured to contact the contact pads
Data Source
AI summary
Some embodiments include a connection device for electrically coupling an electrical device to a test system. The connection device can include at least one suction cup configured to be coupled to the electrical device, spring loaded connector pins configured to electrically couple the electrical device to the test system, and a support frame coupled to the at least one suction cup and the spring loaded connector pins. The at least one suction cup can include three suction cups including a first suction cup, a second suction cup, and a third suction cup, and the support frame can include a first end coupled to the first suction cup, a second end opposite the first end and coupled to the second suction cup, and a third end between the first and second ends and coupled to the third suction cup. Other embodiments of related devices and methods are also described herein.