Sum-Frequency Surface Imaging Beyond the Diffraction Limit

Resolve Bottlenecks,
Find Innovative SolutionsGenerate Solutions

Solution Overview

Problem

Existing non-linear optical spectroscopy techniques are limited by the diffraction limit, making it difficult to visualize objects smaller than 1 micrometer, and electron-scattering techniques require ultrahigh vacuum environments, which are not feasible for many industrial applications, while photoactivatable labels can contaminate or alter the sample.

Innovation Solution

A surface sensing system using sum-frequency vibrational spectroscopy with a visible light beam and a tunable IR beam to induce optical resonance within imaged structures, allowing for super-resolution imaging without the need for foreign labels, utilizing a scanning structure, light filter, and light detection system to generate images with improved resolution.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If non-linear optical spectroscopy is used to detect surface materials, then material identification capability is improved, but spatial resolution deteriorates due to diffraction limit

Engineering Contradiction:

Improvematerial identification capabilityVSAvoidspatial resolution

Core Design Contradiction:

Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent segments the detection process by separating the excitation function (broadband IR source) from the detection function (visible light collection), allowing the system to overcome the diffraction limit while maintaining material identification capability through sum-frequency generation spectroscopy

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent changes the detection parameter from direct IR detection (diffraction-limited) to visible light detection via sum-frequency generation, enabling super-resolution imaging by detecting visible photons generated at the surface interface

Inventive Principle:

Principle #35Parameter changes

2Manufacturing precision

If electron-scattering techniques are used to achieve high resolution imaging, then spatial resolution is improved, but operational complexity worsens due to ultrahigh vacuum requirement

Engineering Contradiction:

Improvespatial resolutionVSAvoidoperational simplicity

Core Design Contradiction:

Manufacturing precisionVSEase of operation

Solution Approach 1:

The patent replaces the mechanical electron-scattering system requiring ultrahigh vacuum with an optical system using photon interaction and sum-frequency generation that can operate in ambient conditions, maintaining high spatial resolution while dramatically simplifying operational requirements

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If photoactivatable labels are added to enhance contrast, then detection contrast is improved, but sample purity worsens due to contamination

Engineering Contradiction:

Improvedetection contrastVSAvoidsample purity

Core Design Contradiction:

Measurement precisionVSLoss of substance

Solution Approach 1:

The patent enables the sample to serve itself by utilizing its naturally occurring vibrational modes and surface properties to generate the contrast signal through sum-frequency generation, eliminating the need for external photoactivatable labels and preserving sample purity

Inventive Principle:

Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables super-resolution imaging of structures smaller than 1 micrometer by inducing optical resonance with naturally occurring surface features, providing enhanced surface sensing capabilities and avoiding contamination from photoactive tags.

Implementation Method 1

The emitted light beam includes a sum frequency signal between the visible light beam and the tunable IR beam

Methodology Applied

Scientific EffectSum-frequency generation: Second Harmonic Generation

Implementation Method 2

the tunable IR beam to selectively induce resonance within an imaged structure that is positioned on the scanned surface

Methodology Applied

Scientific EffectOptical resonance: Resonance

Implementation Method 3

a light filter configured to receive an emitted beam from the scanned surface and to filter the emitted beam to generate a filtered light beam

Methodology Applied

Scientific EffectOptical filtering: Filter (optical)

Data Source

PatentUS12510350B2Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

Publication Date: 2025.12.30 THE BOEING CO

AI summary

Surface sensing methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy are disclosed herein. The methods include exposing a sampled location of the scanned surface to a visible light beam and exposing the sampled location to a tunable infrared beam such that the tunable infrared beam is at least partially coincident with the visible light beam. The methods also include varying a frequency of the tunable infrared beam an inducing optical resonance within an imaged structure that extends at least partially within the sampled location. The methods further include receiving at least a portion of an emitted light beam from the sampled location and scanning the visible light beam and the runnable infrared beam across the scanned portion of the scanned surface. The methods also include generating an image of the scanned portion of the scanned surface based upon the receiving and the scanning.