Super-Large Deformation Measurement via Mark Point Tracking

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Solution Overview

Problem

Current methods lack a unified measurement standard for super-large deformation, making objective measurement and comparison of deformation degrees impossible, which restricts the application of such materials in industrial and military fields.

Innovation Solution

A method involving the arrangement of mark points on a plane for image recognition, calculating deformation gradient matrices, and determining elongation, strain, and angular tensors to quantify rotation deformation, allowing for objective measurement of super-large deformation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional measurement methods are used for super-large deformation, then measurement process is simple, but measurement precision and objectivity are insufficient

Engineering Contradiction:
Improvedeformation measurement precisionVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement plane is divided into multiple discrete mark points that can be independently tracked. Each mark point's deformation is measured separately through image recognition, allowing precise local deformation characterization without requiring complex continuous measurement systems.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Mark points are introduced as intermediary elements to enable measurement. These marks serve as mediators between the deformation field and the measurement system, allowing optical methods to capture deformation information that would otherwise be difficult to quantify objectively.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If rotation deformation is not considered, then measurement process is simplified, but measurement completeness and accuracy deteriorate

Engineering Contradiction:
Improvedeformation characterization accuracyVSAvoidcalculation system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement system transitions from static deformation measurement to dynamic deformation measurement by incorporating rotation angles and curvature changes. The deformation gradient matrix and its decomposition capture the time-varying nature of super-large deformation including rotational components.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

Additional deformation parameters (rotation angles, curvature, orthogonal tensor components) are introduced to fully characterize super-large deformation. These parameter changes enable comprehensive description of both tensile and rotational deformation modes without oversimplification.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If unified measurement standard is not established, then measurement flexibility is maintained, but measurement objectivity and comparability are lost

Engineering Contradiction:
Improvedeformation measurement objectivityVSAvoidmeasurement standard complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement system is designed to be universally applicable to various super-large deformation scenarios including rubber, biological tissues, and metal forming. The same mark point-based image recognition and deformation gradient calculation methodology can be applied across different materials and deformation modes.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

A standardized set of deformation parameters (deformation gradient matrix, elongation tensor, orthogonal tensor, rotation angle, curvature) is established as the unified measurement standard. These parameters provide objective and comparable measurements across different applications while maintaining measurement flexibility.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20230228562A1Method for measuring super-large deformation of plane
Publication Date: 2023.07.20 CHONGQING UNIV
  • US20230228562A1 patent drawing
  • US20230228562A1 patent drawing
  • US20230228562A1 patent drawing

AI summary

A method includes the steps of arranging mark points for image recognition on a plane of a test piece to be measured; recognizing and recording positions of two-dimensional Cartesian coordinates of each mark point of the test piece to be measured before and after each stretching; and determining a deformation gradient of each mark point and deformation measurement parameters of each mark point through a numerical method, where the deformation measurement parameters include a deformation gradient matrix, an elongation tensor matrix, a finite strain tensor matrix, an orthogonal tensor matrix, an angular tensor matrix, a rotation angle, and a curvature. According to the method, objective measurement of super-large deformation of the plane relating to rotation deformation is achieved.