Multi-Superconducting Layer Integration via Hard Mask Etching

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Solution Overview

Problem

Existing methods for integrating multiple superconducting materials on a substrate face challenges due to secondary pollution, low thermal budget, and high equipment requirements, limiting their universal applicability.

Innovation Solution

A method involving the sequential deposition of superconducting material layers on a substrate, using hard masks for regional control, followed by etching treatment to achieve precise integration of multiple superconducting materials, utilizing techniques like photolithography and dry/wet etching to selectively remove materials and maintain purity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a simple organic photoresist is used for regional growth, then the process is simple, but it causes secondary pollution and has very low thermal budget

Engineering Contradiction:
Improveprocess simplicityVSAvoidsecondary pollution
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The patent extracts and removes the harmful organic photoresist from the process entirely, replacing it with inorganic hard masks (silicon nitride, silicon oxide) that can be deposited via PVD or CVD and removed via wet etching, thereby eliminating secondary pollution while maintaining processability

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the material parameters from organic photoresist to inorganic hard masks, and changes the removal mechanism from thermal decomposition to wet chemical etching, thereby eliminating pollution while improving thermal budget through higher etching selectivity and control

Inventive Principle:
Principle #35Parameter changes

2Ease of manufacture

If a simple organic photoresist is used for regional growth, then the process is simple, but the thermal budget is very low

Engineering Contradiction:
Improveprocess simplicityVSAvoidthermal budget
Core Design Contradiction:
Ease of manufactureVSTemperature

Solution Approach 1:

The patent extracts the organic photoresist and replaces it with inorganic hard masks that have high thermal stability and can withstand higher processing temperatures, thereby increasing the thermal budget while maintaining ease of manufacture through standard semiconductor fabrication processes

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the material composition from organic to inorganic, fundamentally altering the thermal properties and enabling higher processing temperatures and better thermal management during subsequent fabrication steps

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If a desolventizing method is used for regional selective growth, then selective growth is achieved, but the requirements on preparation equipment are very high

Engineering Contradiction:
Improveregional selective growth precisionVSAvoidpreparation equipment requirements
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent employs hard masks that are compatible with standard semiconductor fabrication equipment (PVD, CVD, wet etching tools), making the process universally applicable across existing manufacturing lines without requiring specialized or complex equipment

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent changes the material system to inorganic hard masks that can be processed using conventional semiconductor manufacturing parameters and equipment, thereby achieving regional selective growth with standard rather than specialized equipment

Inventive Principle:
Principle #35Parameter changes

4Manufacturing precision

If a desolventizing method is used for regional selective growth, then selective growth is achieved, but the thermal budget is very low

Engineering Contradiction:
Improveregional selective growth precisionVSAvoidthermal budget
Core Design Contradiction:
Manufacturing precisionVSTemperature

Solution Approach 1:

The patent extracts the organic photoresist and replaces it with inorganic hard masks that have high thermal stability, thereby increasing the thermal budget while maintaining the precision of regional selective growth through controlled wet etching processes

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent fundamentally changes the material parameters from organic to inorganic, enabling higher processing temperatures and improved thermal management while maintaining precise regional selectivity through etching parameter control

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables efficient and precise integration of multiple superconducting materials on a single substrate, overcoming previous limitations and laying the foundation for advanced quantum devices and circuits.

Implementation Method 1

depositing a first superconducting material layer on a substrate, the first superconducting material layer being formed by covering a first superconducting material in a first target region range with a first hard mask

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Implementation Method 2

performing etching treatment on the second hard mask and the second superconducting material to obtain a second superconducting material layer

Methodology Applied
Scientific EffectEtching:

Data Source

PatentUS20240114804A1Method for preparing multi-superconducting material layers, quantum device and quantum chip
Publication Date: 2024.04.04 Z-AXIS PTE LTD
  • US20240114804A1 patent drawing
  • US20240114804A1 patent drawing
  • US20240114804A1 patent drawing

AI summary

A method for preparing multi-superconducting material layers includes: depositing a first superconducting material layer on a substrate, the first superconducting material layer being formed by covering a first superconducting material in a first target region range with a first hard mask in the first target region range; depositing a second superconducting material on the substrate deposited with the first superconducting material layer; covering the second superconducting material with a second hard mask; and performing etching treatment on the second hard mask and the second superconducting material to obtain a second superconducting material layer formed by covering the second superconducting material in a second target region range with the second hard mask in the second target region range.