Superconductor Tape Nanocolumn Alignment via X-ray Monitoring
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Solution Overview
Problem
Superconducting tapes with high levels of Zr addition do not consistently achieve high lift factors at lower temperatures in magnetic fields, limiting their critical current performance in applications like wind generators.
Innovation Solution
The development of superconductor tapes with a strong alignment of BaMO3 nanocolumns along the c-axis of the REBCO films, achieved through controlled doping with Zr and real-time monitoring using in-line X-ray Diffraction to ensure optimal compositional ratios and nanocolumn alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If high levels of Zr addition are used in superconducting tapes, then critical current density at 77K is improved, but lift factor at lower temperatures in magnetic fields becomes inconsistent
Solution Approach 1:
The patent changes the compositional parameters by optimizing the Zr addition level to a specific range (0.5-3.0 atomic percent) rather than using high levels, and controls the c-axis lattice constant to be greater than 11.74 Angstroms. These parameter changes ensure consistent nanocolumn alignment and reliable lift factor performance in magnetic fields while maintaining adequate critical current density.
2Strength
If BaMO3 nanocolumns are self-assembled during film growth, then pinning strength is improved, but nanocolumn alignment along c-axis is not consistent
Solution Approach 1:
The patent modifies the growth parameters by controlling the c-axis lattice constant to be greater than 11.74 Angstroms and optimizing the BaMO3 composition ratio. These parameter changes guide the self-assembly process to produce consistently aligned nanocolumns along the c-axis direction, achieving both strong pinning and precise alignment.
Solution Approach 2:
The patent implements in-line X-ray diffraction monitoring during the deposition process to provide real-time feedback on nanocolumn alignment. This feedback mechanism allows for immediate detection and correction of alignment deviations, ensuring consistent manufacturing precision of the nanocolumn structure.
3Manufacturing precision
If in-line X-ray Diffraction is used for real-time monitoring, then manufacturing precision is improved, but device complexity increases
Solution Approach 1:
The in-line X-ray diffraction system is integrated directly into the deposition apparatus, allowing the manufacturing process to self-monitor and self-adjust without requiring separate external measurement equipment. This integration minimizes additional device complexity while achieving precise compositional control through real-time feedback.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach consistently achieves high critical currents at lower temperatures in magnetic fields, enhancing the performance of superconducting tapes in applications requiring high magnetic field stability.
Implementation Method 1
measuring the c-axis lattice parameter of the superconductor film via in-line X-ray Diffraction in real-time during deposition of the superconductor film over the buffer layer
Implementation Method 2
a thin film of materials with rock-salt crystal structure such as MgO is deposited by ion beam-assisted deposition over flexible, polycrystalline substrates
Implementation Method 3
create epitaxial, single-crystal-like thin films on polycrystalline substrates
Data Source
AI summary
A superconductor tape and method for manufacturing, measuring, monitoring, and controlling same are disclosed. Embodiments are directed to a superconductor tape which includes a superconductor film overlying a buffer layer which overlies a substrate. In one embodiment, the superconductor film is defined as having a c-axis lattice constant higher than 11.74 Angstroms. In another embodiment, the superconductor film comprises BaMO3, where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO3 elongated along an axis that is between 60° to 90° from an axis of the (001) peaks of the superconductor film. These and other embodiments achieve well-aligned nanocolumnar defects and thus a high lift factor, which can result in superior critical current performance of the tape in, for example, high magnetic fields.