Superjunction Power MOSFET with Surrounding LDD Region

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Solution Overview

Problem

Conventional power MOSFETs face challenges in reducing conduction losses (RDSON) and switching losses (Cgd and Qg), with trench MOSFETs exhibiting high switching power loss and lateral double-diffused MOSFETs having higher RDSON, leading to increased energy absorption and heat dissipation issues.

Innovation Solution

The use of a superjunction structure with N-doped and P-doped stripes as the drift region in power MOSFETs, which reduces RDSON without significantly increasing Qg, by calibrating doping concentrations and stripe widths to maintain high BVdss and minimize hot carrier generation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of energy

If superjunction structure with higher doping concentration is used to reduce RDSON, then conduction loss is improved, but hot carrier generation increases

Engineering Contradiction:
Improveconduction lossVSAvoidhot carrier generation
Core Design Contradiction:
Loss of energyVSObject-generated harmful factors

Solution Approach 1:

The patent introduces the P-type doped stripes as intermediary elements between the N-type conduction paths and the drain region. These P-type stripes act as mediators that facilitate controlled depletion region formation and charge balance, enabling the use of higher N-type doping concentrations (for low RDSON) while the P-type regions prevent excessive hot carrier generation by providing complementary charge compensation and controlling electric field distribution.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent applies parameter changes by carefully controlling the doping concentration ratio and width ratio between N-type and P-type stripes. By optimizing these parameters, the superjunction structure enables high N-type doping (reducing RDSON and conduction loss) while the corresponding P-type doping levels and stripe dimensions are adjusted to maintain electric field control and minimize hot carrier generation through balanced charge distribution.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The superjunction structure effectively lowers RDSON and switching losses, reducing energy absorption and heat dissipation while maintaining high voltage handling capabilities, thus improving the overall efficiency and reliability of power MOSFETs.

Implementation Method 1

The use of a superjunction structure with N-doped and P-doped stripes as the drift region in power MOSFETs, which reduces RDSON without significantly increasing Qg, by calibrating doping concentrations and stripe widths to maintain high BVdss

Methodology Applied
Scientific EffectDoping: Dopants

Data Source

PatentUS10199459B2Superjunction with surrounding lightly doped drain region
Publication Date: 2019.02.05 GREAT WALL SEMICONDUCTOR CORP
  • US10199459B2 patent drawing
  • US10199459B2 patent drawing
  • US10199459B2 patent drawing

AI summary

A semiconductor device has a substrate and a lightly doped drain (LDD) region formed in the substrate. A superjunction is formed in the LDD region.