Supplemental Data Integrity Scan for Memory Read Disturb Errors

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Solution Overview

Problem

Probabilistic data integrity scan schemes in memory subsystems are inadequate in addressing read disturb errors, particularly for non-localized read patterns and memory locations not subject to host reads, leading to potential data reliability failures.

Innovation Solution

Supplementing probabilistic data integrity scans with additional scans that target randomly or deterministically selected data blocks, including those not recently scanned, to ensure comprehensive data integrity sampling across both localized and non-localized read patterns and stress-induced memory locations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Use of energy by moving object

If probabilistic data integrity scan schemes are used, then resource consumption is reduced, but data reliability deteriorates due to inadequate coverage of non-localized read patterns and unscanned memory locations

Engineering Contradiction:
Improveresource consumptionVSAvoiddata reliability
Core Design Contradiction:
Use of energy by moving objectVSReliability

Solution Approach 1:

The system performs preliminary classification of read operations into localized and non-localized patterns, and proactively schedules supplemental integrity scans for memory locations that are not immediate victims but may be affected by future read disturb, thereby preventing errors before they occur

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The memory system segments integrity scanning into two distinct approaches: probabilistic scanning for immediate victim locations and deterministic supplemental scanning for non-victim locations, allowing each segment to be optimized for its specific purpose while collectively achieving comprehensive coverage

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If probabilistic data integrity scans are performed on victim locations, then detection of read disturb errors is improved, but coverage of non-localized read patterns and unscanned memory locations deteriorates

Engineering Contradiction:
Improveerror detection capabilityVSAvoidcoverage of memory locations
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The supplemental integrity scan mechanism serves multiple functions: it scans non-victim memory locations, covers non-localized read patterns, identifies potential future victims, and provides comprehensive memory coverage, thereby making the integrity scanning system universally applicable to all memory locations regardless of their immediate risk status

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20220334751A1Probabilistic data integrity scan enhanced by a supplemental data integrity scan
Publication Date: 2022.10.20 MICRON TECHNOLOGY INC
  • US20220334751A1 patent drawing
  • US20220334751A1 patent drawing
  • US20220334751A1 patent drawing

AI summary

Exemplary methods, apparatuses, and systems include receiving a plurality of read operations directed to a portion of memory accessed by a memory channel. The plurality of read operations are divided into a current set of a sequence of read operations and one or more other sets of sequences of read operations. An aggressor read operation is selected from the current set. A supplemental memory location is selected independently of aggressors and victims in the current set of read operations. A first data integrity scan is performed on a victim of the aggressor read operation and a second data integrity scan is performed on the supplemental memory location.