Substrate Support Plate Geometry for Uniform Charge Discharge

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Solution Overview

Problem

Existing substrate support devices in semiconductor manufacturing face challenges in efficiently discharging residual charges after processing, leading to substrate sticking and breaking issues, which affect productivity.

Innovation Solution

A substrate processing apparatus with a chamber, substrate support platform, lamp, and a plate with specific hole configurations and a reflection portion that enhances light dispersion and irradiation, allowing for improved discharge performance and voltage monitoring.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional plate structure is used with uniform holes, then the manufacturing is simple, but the light distribution on the substrate support platform is uneven, resulting in poor discharge performance

Engineering Contradiction:
Improvedischarge performanceVSAvoidplate structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The plate structure employs different hole configurations in different regions: the first region has holes with first diameters while the second region has holes with second diameters that are different from the first diameters. This local variation in hole quality enables differentiated light distribution across the substrate support platform, improving discharge performance in specific areas without requiring complete structural redesign.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The plate is divided into multiple regions (first region and second region) with distinct hole patterns. This segmentation allows independent optimization of light distribution in different areas, enabling the system to achieve uniform overall discharge performance while maintaining manageable manufacturing complexity through modular design.

Inventive Principle:
Principle #1Segmentation

2Reliability

If the plate structure is modified to improve light distribution, then the discharge performance improves, but the manufacturing complexity increases

Engineering Contradiction:
Improvesurface discharge performanceVSAvoidplate manufacturing ease
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

Instead of redesigning the entire plate structure, the invention applies localized modifications by creating different hole diameters in specific regions. This approach improves surface discharge performance where needed while keeping the overall manufacturing process similar to conventional plates, thus balancing performance improvement with manufacturing ease.

Inventive Principle:
Principle #3Local quality

3Productivity

If residual charges are not properly discharged, then the substrate support device maintains electrostatic grip, but substrate sticking and breaking occurs

Engineering Contradiction:
Improvemanufacturing efficiencyVSAvoidsubstrate integrity
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements a discharge operation that irradiates light through the plate structure with differentiated hole diameters before substrate processing. This preliminary discharge action removes residual charges that would otherwise cause substrate sticking and breaking during subsequent processing, ensuring substrate integrity while maintaining manufacturing efficiency.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The differentiated hole diameters in different plate regions create localized light distribution patterns that effectively discharge residual charges across the substrate support surface. This ensures uniform charge elimination, preventing substrate sticking and breaking while maintaining high productivity through efficient discharge operation.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus effectively reduces substrate sticking and breaking phenomena by ensuring even discharge and controlled voltage levels, enhancing productivity in semiconductor device manufacturing.

Implementation Method 1

a lamp disposed at an upper portion of the chamber, and emitting light to an inside of the chamber

Methodology Applied
Scientific EffectLight emission: Light

Implementation Method 2

the plate includes a reflection portion surrounded by the plurality of holes, and the reflection portion of the plate protrudes higher than any other region of the plate

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 3

The substrate support device may support and/or fix the substrate to a surface of the substrate support device by using an electrostatic force

Methodology Applied
Scientific EffectElectrostatic force: Electrostatics

Implementation Method 4

for at least a first hole of the plurality of holes, a diameter of the hole becomes greater in a direction going downward from a top surface of the plate toward a bottom surface of the plate

Methodology Applied
Scientific EffectLight transmission through tapered structure: Geometry

Data Source

PatentUS20260068583A1Substrate processing apparatus, method for manufacturing a semiconductor device including the same, and method for monitoring a substrate support device of the substrate processing apparatus
Publication Date: 2026.03.05 SAMSUNG ELECTRONICS CO LTD
  • US20260068583A1 patent drawing
  • US20260068583A1 patent drawing
  • US20260068583A1 patent drawing

AI summary

A substrate processing apparatus including a chamber, a substrate support platform provided inside the chamber, a lamp disposed at an upper portion of the chamber, and emitting light to an inside of the chamber, and a plate interposed between the lamp and the substrate support platform in the chamber, and including a plurality of holes through which the light, when emitted by the lamp, passes, wherein a surface of the substrate support platform is positioned to be irradiated with the light, and wherein for at least a first hole of the plurality of holes, a diameter of the hole becomes greater in a direction going downward from a top surface of the plate toward a bottom surface of the plate.