Surface Density Measurement with Real-Time Pose Deviation Correction
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Solution Overview
Problem
Inaccurate measurement results in surface density devices due to changes in the relative position between the radiation source and the ionization chamber over time, leading to reduced measurement accuracy and potential economic losses.
Innovation Solution
A detection method that involves obtaining current poses of the radiation source and ionization chamber during operation, determining pose deviations, and correcting measurement results based on these deviations to maintain accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the surface density device is used for a long time, then the device can continuously perform measurements, but the relative position between the radiation source and the ionization chamber changes, resulting in inaccurate measurement results
Solution Approach 1:
The patent employs feedback mechanisms by continuously detecting the poses of the radiation source and ionization chamber during operation, comparing current poses with initial poses, and using the detected pose deviations to correct measurement results in real-time, thus maintaining measurement accuracy over extended operation periods
Solution Approach 2:
The patent changes the operational parameters by transitioning from static pose assumptions to dynamic pose detection and correction, where the system actively monitors and adjusts for positional deviations of the radiation source and ionization chamber, allowing continuous operation without sacrificing measurement precision
2Measurement precision
If the device stops operation to correct positional deviations, then measurement accuracy can be restored, but measurement efficiency and productivity decrease
Solution Approach 1:
The patent ensures continuity of useful action by implementing real-time pose detection and correction mechanisms that operate during the measurement process itself, eliminating the need to stop operations for calibration or correction, thus maintaining both high productivity and measurement precision
Solution Approach 2:
The patent replaces mechanical intervention or physical repositioning with detection-based correction, using sensors to detect pose deviations and computational methods to correct measurement results, thereby maintaining measurement accuracy without interrupting the continuous operation of the device
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances measurement accuracy by allowing real-time correction of measurement results without stopping the device, thereby improving efficiency and reducing errors caused by positional changes.
Implementation Method 1
the radiation source emits rays to the object under measurement. The rays pass through the object under measurement and enter the ionization chamber, and the ionization chamber determines a thickness and/or density of the object under measurement according to the degree of attenuation of the rays
Implementation Method 2
the ionization chamber determines a thickness and/or density of the object under measurement according to the degree of attenuation of the rays
Data Source
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AI summary
A detection method, a surface density device (100), a detection means (200), and a storage medium are provided. The surface density device (100) includes a radiation source (10) and an ionization chamber (20) spaced from the radiation source (10). The detection method includes: obtaining, during operation of the surface density device, a first current pose of the radiation source (10) and a second current pose of the ionization chamber (20); determining a first pose deviation of the radiation source (10) based on the first current pose; determining a second pose deviation of the ionization chamber (20) based on the second current pose; and determining whether the radiation source (10) has undergone a pose change with respect to the ionization chamber (20) based on the first pose deviation and the second pose deviation.