Surface Inspection Imaging for Defect vs Luminance Unevenness
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Solution Overview
Problem
Existing inspection technologies incorrectly detect low luminance areas as defects, leading to reinspection and decreased productivity due to poor discrimination between defects and luminance unevenness.
Innovation Solution
An inspection device that picks up multiple surface images at varying angles to discriminate between defects and luminance unevenness by analyzing changes in luminance distribution in both bright and dark fields.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If single image inspection is performed, then inspection speed is maintained, but discrimination accuracy between defects and luminance unevenness deteriorates
Solution Approach 1:
The patent performs preliminary image acquisition at multiple angles and luminance conditions before final defect determination. By collecting multiple surface images under different illumination angles and calculating luminance distribution characteristics in advance, the system prepares comprehensive data that enables accurate discrimination between defects and luminance unevenness without requiring repeated inspection cycles.
Solution Approach 2:
The patent transitions from single-angle inspection to multi-angle inspection, adding the dimension of inspection angle to the traditional single-image assessment. By acquiring images at multiple angles and analyzing luminance distribution characteristics across these different angular perspectives, the system gains additional dimensional information that enables accurate discrimination between actual defects and surface luminance variations.
2Measurement precision
If multiple images are picked up to improve discrimination accuracy, then defect detection precision improves, but inspection time increases
Solution Approach 1:
The patent performs preliminary image acquisition at multiple angles and luminance conditions before final defect determination. By collecting multiple surface images under different illumination angles and calculating luminance distribution characteristics in advance, the system prepares comprehensive data that enables accurate discrimination between defects and luminance unevenness without requiring repeated inspection cycles.
Solution Approach 2:
The patent maintains continuous image acquisition and processing operations without interruption. By systematically capturing multiple images at different angles and continuously calculating luminance distribution characteristics, the system ensures that all necessary data is gathered in a single continuous inspection cycle, eliminating the need for time-consuming reinspection cycles.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Improves discrimination accuracy between defects and luminance unevenness, enhancing productivity in the inspection process by accurately distinguishing between different surface conditions.
Implementation Method 1
an illumination part configured to irradiate a surface of the object to be inspected with light
Implementation Method 2
an image pickup part configured to pick up an image of the object to be inspected
Data Source
AI summary
A plurality of surface images are picked up while changing a relative posture of a surface of an object to be inspected with respect to an image pickup part configured to pick up an image of the surface of the object to be inspected under a state in which the surface of the object to be inspected is irradiated with light, and a defect and luminance unevenness of the surface of the object to be inspected are discriminated from each other based on a change in the plurality of surface images.