Near-Surface Material Testing Using Thermal and Reflected Radiation
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Solution Overview
Problem
Existing methods for determining material properties near the surface of a test specimen are limited in their reliability and non-destructive capabilities, particularly in assessing properties like layer thickness and quality of coatings.
Innovation Solution
An apparatus and method utilizing electromagnetic radiation to evaluate thermal and reflected radiation, employing a radiation source, detection device, and evaluation device to determine material properties by comparing reference and measurement signals, enabling precise and non-destructive analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If photothermics method is used to determine layer thickness by detecting thermal radiation, then layer thickness can be ascertained, but the method is limited in reliability and applicability for near-surface material properties
Solution Approach 1:
The patent segments the measurement approach by separating thermal radiation detection from reflected radiation detection, using two different detection devices to measure different physical phenomena. This segmentation allows each detection method to be optimized for its specific purpose, improving overall measurement reliability while maintaining precision.
Solution Approach 2:
The apparatus is designed with multi-functionality by incorporating both thermal radiation detection and reflected radiation detection capabilities. This universal design enables the system to determine various near-surface material properties (layer thickness, coating quality, surface characteristics) using a single integrated system, enhancing reliability through multiple measurement pathways.
2Object-affected harmful factors
If existing non-destructive testing methods are used, then surface defects can be detected, but they cannot reliably determine material properties near the surface
Solution Approach 1:
The patent utilizes parameter changes in electromagnetic radiation interaction with materials. By measuring both thermal radiation (related to thermal conductivity and heat capacity) and reflected radiation (related to optical properties and surface characteristics), the system extracts multiple material parameters that collectively provide precise near-surface property determination beyond simple defect detection.
3Device complexity
If a single detection method is used, then the device complexity is low, but the versatility for determining various material properties is limited
Solution Approach 1:
The patent merges two different detection methods (thermal radiation detection and reflected radiation detection) into a single integrated apparatus. This combination allows the system to determine multiple material properties (layer thickness, coating quality, surface characteristics) simultaneously, achieving high versatility while managing device complexity through integrated design.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable and non-destructive determination of material properties, such as layer thickness and quality, with high precision and flexibility for various test specimens.
Implementation Method 1
A surface region of a substrate covered with a coating layer is irradiated with a laser, whereby said region is heated and, in particular, depending on a layer thickness and a coating material, thermal radiation is emitted
Implementation Method 2
a detection device for detecting thermal radiation emitted by the surface region or for detecting radiation reflected from the surface region of the test specimen
Data Source
AI summary
The invention relates to an apparatus (1; 1a; 1b; 1c) and a method for determining a material property of a test specimen (5; 5a; 5b; 5c) in a test specimen region (6; 6a; 6b; 6c) near the surface, said apparatus comprising at least one electromagnetic radiation source (2; 2a; 2b; 2c) for irradiating at least one surface region (4; 4a; 4b; 4c) of the test specimen, and a detection device (8; 8a; 8b; 8c) for detecting thermal radiation (9; 9a; 9b) emitted by the surface region and/or for detecting radiation (31) reflected from the surface region (4; 4a; 4b; 4c) of the test specimen. An evaluation device (13; 13a; 13b; 13c) for ascertaining the material property to be determined on the basis of the emitted thermal radiation (9; 9a; 9b) and/or the reflected radiation (31) is expediently provided. Advantageously, it is possible for the material property to be determined particularly reliably and nondestructively.