Overlaying Measurement Curves on Optical Images for Surface Analysis

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Solution Overview

Problem

Current methods for analyzing surface measurements, such as scratch tests and profilometric measurements, fail to seamlessly integrate graphic representations of measurement curves with high-magnification optical images, leading to difficulties in accurately correlating image positions and measurement data, especially when the sample is moved.

Innovation Solution

An automatic table system is used to synchronize table coordinates with measurement paths, allowing measurement curves to be displayed directly over live or saved images, with X-coordinates matching those of the image, and enabling automatic adjustment of curve display based on image width, along with options for shifting and adjusting graphic position and brightness for optimal visibility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If measurement curves are displayed separately from optical images, then data analysis is simplified, but correlation between image position and measurement data is lost

Engineering Contradiction:
Improvedata analysisVSAvoidspatial correlation
Core Design Contradiction:
Ease of operationVSLoss of information

Solution Approach 1:

The patent merges the measurement curve display with the optical image by overlaying the curve onto the image. The curve is rendered on top of the captured image, allowing simultaneous visualization of both the visual field and measurement data. This combining approach maintains spatial correlation while enabling data analysis, as the curve points directly correspond to positions in the image without requiring separate displays.

Inventive Principle:
Principle #5Merging (Combining)

2Area of stationary object

If the stylus path is much longer than the image width, then comprehensive surface coverage is achieved, but the magnification becomes too high to display the entire curve in the image

Engineering Contradiction:
Improvesurface coverageVSAvoidcurve visualization
Core Design Contradiction:
Area of stationary objectVSEase of operation

Solution Approach 1:

The patent implements dynamic adjustment of the displayed curve portion based on the current optical image field of view. As the stage moves and the image captures different portions of the surface, the system automatically adjusts which segment of the measurement curve is overlaid on the image. This dynamic adaptation allows the entire surface to be covered while maintaining appropriate curve visualization for each local view, solving the contradiction between comprehensive coverage and manageable display.

Inventive Principle:
Principle #15Dynamics

3Adaptability or versatility

If the sample is moved during measurement, then different surface areas can be analyzed, but the correlation between image and curve positions becomes inaccurate

Engineering Contradiction:
Improvesurface area analysisVSAvoidposition correlation
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent employs feedback mechanisms where the system continuously tracks stage position and image field of view during sample movement. The measurement curve display is dynamically adjusted based on real-time feedback about the current image position and magnification. This feedback loop ensures that even as the sample moves and different areas are analyzed, the overlaid curve accurately corresponds to the visible portion of the surface, maintaining position correlation precision throughout the measurement process.

Inventive Principle:
Principle #23Feedback

Data Source

PatentEP3385698B1Method for the analysis of surface measurements
Publication Date: 2023.08.09 ASMEC ADVANCED SURFACE MECHANICS
  • EP3385698B1 patent drawingFigure 1~2
  • EP3385698B1 patent drawingFigure 3

AI summary

The invention relates to a method for analyzing surface measurements, in particular scratch tests, wear tests or profilometric measurements, wherein a graphic with representable curves in the form of measurement curves of already analyzed results with an X-axis as a coordinate axis along a measurement path is superimposed on a live image or subsequently on a stored image of the measurement path such that the X-coordinates in the image correspond to the X-coordinates of the curves.